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Review of THz-based semiconductor assurance
Terahertz radiation for inspection and fault detection has been of interest for the
semiconductor industry since the first generation and detection of THz signals. Until recent …
semiconductor industry since the first generation and detection of THz signals. Until recent …
Analysis and control of Cu6Sn5 preferred nucleation on single crystal (0 0 1) Cu
HR Ma, C Dong, N Zhao, YP Wang, XG Li, HT Ma… - Materials Letters, 2020 - Elsevier
Fully oriented-intermetallic interconnects (FOI) of high melting point and service
performance have highly considerable potential application in the current generation of 3D …
performance have highly considerable potential application in the current generation of 3D …
A novel intermetallic compound insertion bonding to improve throughput for sequential 3-D stacking
L Hou, J Derakhshandeh, G Capuz… - IEEE Transactions …, 2020 - ieeexplore.ieee.org
This article provides a novel 3-D die-to-wafer (D2W) bonding method using intermetallic
compound (IMC) layer insertion into a soft Sn bump to generate mechanical connection of …
compound (IMC) layer insertion into a soft Sn bump to generate mechanical connection of …
A Novel Resistance Measurement Methodology for UBM/Solder Interfacial Reaction Monitoring
L Hou, J Derakhshandeh, E Beyne… - IEEE Transactions on …, 2019 - ieeexplore.ieee.org
This article presents a methodology to investigate, in situ, the interfacial solid-state reaction
of alternative metallurgical systems, such as Cu/Ni/Sn and Ni/Cu/Sn bumps. The …
of alternative metallurgical systems, such as Cu/Ni/Sn and Ni/Cu/Sn bumps. The …
Growth mechanism and kinetics of Cu3Sn in the interfacial reaction between liquid Sn and diversely oriented Cu substrates
M Shang, C Dong, H Ma, H Ma, Y Wang - Journal of Materials Science …, 2022 - Springer
In this study, the effects of reflow temperature, reflow time, and substrates (polycrystalline
and (001/110/111) monocrystalline Cu substrates) on the growth of Cu3Sn at the Cu/Sn3Ag …
and (001/110/111) monocrystalline Cu substrates) on the growth of Cu3Sn at the Cu/Sn3Ag …
[HTML][HTML] IMCs microstructure evolution dependence of mechanical properties for Ni/Sn/Ni micro solder-joints
N Ren, H Fang, D Wang, C Hou, Y Zhao, F Chen… - Materials, 2020 - mdpi.com
The current miniaturization trend of microelectronic devices drives the size of solder joints to
continually scale down. The miniaturized joints considerably increase intermetallic …
continually scale down. The miniaturized joints considerably increase intermetallic …
From 3D-IC to 3D-HI for Environmentally Durable Rugged Electronics (EnDuRE)
JM Kim, MS Kim, MM Hussain - IEEE Electron Devices …, 2024 - ieeexplore.ieee.org
The pursuit of higher packing density has propelled the shift towards three-dimensional (3D)
integrated circuits (3D-ICs), promising heightened performance, accelerated data speeds …
integrated circuits (3D-ICs), promising heightened performance, accelerated data speeds …
FPGA-based testing system of NAND-memory multi-chip modules
S Podryadchikov, V Putrolaynen, M Belyaev… - Microelectronics …, 2019 - Elsevier
The article presents a hardware and software system used for functional testing of NAND-
memory chips based on FPGA. The system's module structure allows simultaneous testing …
memory chips based on FPGA. The system's module structure allows simultaneous testing …
Multi-chip Modules and Multi-chip Packaging
In the previous chapter, the concept of the SoC, where all system circuitry is placed on one
die, and that die is packaged, was discussed. It was stated that SoC packaging is often …
die, and that die is packaged, was discussed. It was stated that SoC packaging is often …
[KNJIGA][B] Formation Mechanism of Porous Cu3Sn Intermetallic Compounds in Microbumps for 3D-IC Packaging
T Chu - 2018 - search.proquest.com
This thesis presents a study on the formation mechanism of porous Cu 3 Sn intermetallic
compounds in microbumps for 3D-IC packaging, which are issues of importance to the …
compounds in microbumps for 3D-IC packaging, which are issues of importance to the …