[HTML][HTML] NHPP software reliability model considering the uncertainty of operating environments with imperfect debugging and testing coverage

Q Li, H Pham - Applied Mathematical Modelling, 2017 - Elsevier
In this paper, we propose a testing-coverage software reliability model that considers not
only the imperfect debugging (ID) but also the uncertainty of operating environments based …

[PDF][PDF] Derivation of inflection points of nonlinear regression curves-implications to statistics

AT Goshu, PR Koya - … Journal of Theoretical and Applied Statistics, 2013 - researchgate.net
In this paper, we derive inflection points for the commonly known growth curves, namely,
generalized logistic, Richards, Von Bertalanffy, Brody, logistic, Gompertz, generalized …

Effort based software reliability model with fault reduction factor, change point and imperfect debugging

S Khurshid, AK Shrivastava, J Iqbal - International Journal of Information …, 2021 - Springer
The growing need of software's in almost every sphere of life has increased the demand of
producing error free software's. But producing high quality software needs resources (effort …

Software reliability growth modeling with dynamic faults and release time optimization using GA and MAUT

B Pachauri, A Kumar, J Dhar - Applied Mathematics and Computation, 2014 - Elsevier
Software testing is an essential part of software life cycle as during this period, an effort is
made to improve software reliability and quality. In this phase, perfect debugging is not …

Imperfect debugging study of SRGM with fault reduction factor and multiple change point

M Jain, T Manjula, TR Gulati - International Journal of …, 2014 - inderscienceonline.com
The present investigation deals with the software reliability growth models (SRGMs) with
imperfect debugging, testing effort function (TEF) and fault reduction factor (FRF). FRF is …

Generalized software reliability model considering uncertainty and dynamics: Model and applications

K Honda, H Washizaki, Y Fukazawa - International Journal of …, 2017 - World Scientific
Today's development environment has changed drastically; the development periods are
shorter than ever and the number of team members has increased. Consequently …

[PDF][PDF] Analysis of delayed S-shaped software reliability growth model with time dependent fault content rate function

DD Hanagal, NN Bhalerao - Journal of Data Science, 2018 - pdfs.semanticscholar.org
Many software reliability growth models based upon a non-homogeneous Poisson process
(NHPP) have been proposed to measure and asses the reliability of a software system …

[PDF][PDF] A Unified and Flexible Framework of Imperfect Debugging Dependent SRGMs with Testing-Effort.

C Zhang, G Cui, H Liu, F Meng, S Wu - Journal of Multimedia, 2014 - Citeseer
In order to overcome the limitations of debugging process, insufficient consideration of
imperfect debugging and testing-effort (TE) in software reliability modeling and analysis, a …

Side-channel leakage on silicon substrate of CMOS cryptographic chip

D Fujimoto, D Tanaka, N Miura… - … Security and Trust …, 2014 - ieeexplore.ieee.org
Power supply currents of CMOS digital circuits partly flow through a silicon substrate in their
returning (ground) paths. The voltage bounce due to the substrate currents is seen wherever …

[PDF][PDF] Analysis of some software reliability growth models with learning effects

J Iqbal - IJ Mathematical Sciences and Computing, 2016 - scholar.archive.org
A newly developed software system before its deployment is subjected to vigorous testing so
as to minimize the probability of occurrence of failure very soon. Software solutions for safety …