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Towards aging-induced approximations
In recent technology nodes, wide guardbands are needed to overcome reliability
degradations due to aging. Such guardbands manifest as reduced efficiency and …
degradations due to aging. Such guardbands manifest as reduced efficiency and …
On the efficiency of voltage overscaling under temperature and aging effects
Voltage overscaling has received extensive attention in the last decade as an attractive
paradigm for systems in which resulting timing errors and thus a loss in accuracy can be …
paradigm for systems in which resulting timing errors and thus a loss in accuracy can be …
Reliability-aware quantization for anti-aging NPUs
Transistor aging is one of the major concerns that challenges designers in advanced
technologies. It profoundly degrades the reliability of circuits during its lifetime as it slows …
technologies. It profoundly degrades the reliability of circuits during its lifetime as it slows …
Automated design approximation to overcome circuit aging
Transistor aging phenomena manifest themselves as degradations in the main electrical
characteristics of transistors. Over time, they result in a significant increase of cell …
characteristics of transistors. Over time, they result in a significant increase of cell …
Provably fast and near-optimum gate sizing
We present a new approach for the cell selection problem based on a resource sharing
formulation, which is a specialization of Lagrangian relaxation with multiplicative weight …
formulation, which is a specialization of Lagrangian relaxation with multiplicative weight …
Task-based parallel programming for gate sizing
Physical synthesis engines need to embrace all available parallelism to cope with the
increasing complexity of modern designs and still offer high quality of results. To achieve this …
increasing complexity of modern designs and still offer high quality of results. To achieve this …
Instruction-level NBTI stress estimation and its application in runtime aging prediction for embedded processors
Lifetime reliability management of miniaturized CMOS devices continuously gets more
importance with the shrinking of technology size. Neither of existing design-time solutions …
importance with the shrinking of technology size. Neither of existing design-time solutions …
[HTML][HTML] Logical Resolving-Based Methodology for Efficient Reliability Analysis
With the CMOS technology downscaling to the deep nanoscale, the aging effects of devices
degrade circuit performance and even lead to functional failure. The stress analysis is critical …
degrade circuit performance and even lead to functional failure. The stress analysis is critical …
Autonomous application of netlist transformations inside lagrangian relaxation-based optimization
Timing closure is a complex process that involves many iterative optimization steps applied
in various phases of the physical design flow. Lagrangian relaxation (LR)-based …
in various phases of the physical design flow. Lagrangian relaxation (LR)-based …
Design optimization by fine-grained interleaving of local netlist transformations in Lagrangian relaxation
Design optimization modifies a netlist with the goal of satisfying the timing constraints at the
minimum area and leakage power, without violating any slew or load capacitance …
minimum area and leakage power, without violating any slew or load capacitance …