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Single event transients in digital CMOS—A review
The creation of soft errors due to the propagation of single event transients (SETs) is a
significant reliability challenge in modern CMOS logic. SET concerns continue to be …
significant reliability challenge in modern CMOS logic. SET concerns continue to be …
Radiation effects in a post-Moore world
An overview is presented of the significant influences of Moore's Law scaling on radiation
effects on microelectronics, focusing on historical trends and future needs. A number of …
effects on microelectronics, focusing on historical trends and future needs. A number of …
Scaling trends of digital single-event effects: A survey of SEU and SET parameters and comparison with transistor performance
The history of integrated circuit (IC) development is another record of human challenges
involving space. Efforts have been made to protect ICs from sudden malfunctions due to …
involving space. Efforts have been made to protect ICs from sudden malfunctions due to …
Characterization of digital single event transient pulse-widths in 130-nm and 90-nm CMOS technologies
The distributions of SET pulse-widths produced by heavy ions in 130-nm and 90-nm CMOS
technologies are measured experimentally using an autonomous pulse characterization …
technologies are measured experimentally using an autonomous pulse characterization …
Single-event transient pulse quenching in advanced CMOS logic circuits
Heavy-ion broad-beam experiments on a 130 nm CMOS technology have shown
anomalously-short single-event transient pulse widths. 3-D TCAD mixed-mode modeling in …
anomalously-short single-event transient pulse widths. 3-D TCAD mixed-mode modeling in …
New insights into single event transient propagation in chains of inverters—Evidence for propagation-induced pulse broadening
The generation and propagation of single event transients (SET) is measured and modeled
in SOI inverter chains with different designs. SET propagation in inverter chains induces …
in SOI inverter chains with different designs. SET propagation in inverter chains induces …
Addressing transient and permanent faults in NoC with efficient fault-tolerant deflection router
Continuing decrease in the feature size of integrated circuits leads to increases in
susceptibility to transient and permanent faults. This paper proposes a fault-tolerant solution …
susceptibility to transient and permanent faults. This paper proposes a fault-tolerant solution …
Investigation of the propagation induced pulse broadening (PIPB) effect on single event transients in SOI and bulk inverter chains
The propagation of single event transients (SET) is measured and modeled in SOI and bulk
inverter chains. The propagation-induced pulse broadening (PIPB) effect is shown to …
inverter chains. The propagation-induced pulse broadening (PIPB) effect is shown to …
The effect of layout topology on single-event transient pulse quenching in a 65 nm bulk CMOS process
Heavy-ion microbeam and broadbeam data are presented for a 65 nm bulk CMOS process
showing the existence of pulse quenching at normal and angular incidence for designs …
showing the existence of pulse quenching at normal and angular incidence for designs …
Scaling trends in SET pulse widths in sub-100 nm bulk CMOS processes
Digital single-event transient (SET) measurements in a bulk 65-nm process are compared to
transients measured in 130-nm and 90-nm processes. The measured SET widths are …
transients measured in 130-nm and 90-nm processes. The measured SET widths are …