We analyze electron-beam induced carbon contamination in a transmission electron
microscope. The study is performed on thin films potentially suitable as phase plates for …

A systematic study on charging of carbon thin films under intense electron-beam irradiation
was performed in a transmission electron microscope to identify the underlying physics for …

Strong nanoscale light–matter interaction is often accompanied by ultraconfined photonic
modes and large momentum polaritons existing far beyond the light cone. A direct probe of …

Germanium is typically used for solid-state electronics, fiber-optics, and infrared
applications, due to its semiconducting behavior at optical and infrared wavelengths. In …

A method allowing fabrication of nano-dot markers for electron tomography was developed
using an electron beam-induced deposition in an ordinary dual beam instrument (FIB and …

Electron-beam sha** opens up novel imaging possibilities in electron microscopy (EM).
The implementation of a phase or amplitude mask in the condenser lens system allows the …

Spectrum imaging techniques, gaining simultaneously structural (image) and spectroscopic
data, require appropriate and careful processing to extract information of the dataset. In this …

Polystyrene latex (PSL) nanoparticle (NP) sample is one of the most widely used standard
materials. It is used for calibration of particle counters and particle size measurement tools. It …

Electron tomography is a method whereby a three-dimensional reconstruction of a
nanoscale object is obtained from a series of projected images measured in a transmission …

The authors demonstrate that electron tomography allows accurate measurement of
roughness of buried interfaces in multilayer samples. The method does not require the …