Automatic virtual test technology for intelligent driving systems considering both coverage and efficiency
F Gao, J Duan, Z Han, Y He - IEEE Transactions on Vehicular …, 2020 - ieeexplore.ieee.org
The testing of the intelligent driving systems is faced with the challenges of efficiency
because real traffic scenarios are infinite, uncontrollable and difficult to be precisely defined …
because real traffic scenarios are infinite, uncontrollable and difficult to be precisely defined …
Radiation effects in vlsi circuits-part ii: Hardening techniques
A Kannaujiya, AP Shah - IETE Technical Review, 2024 - Taylor & Francis
This work presents a comprehensive review on radiation hardening techniques aimed at
enhancing the resilience of VLSI circuits against soft errors. The study covers a wide …
enhancing the resilience of VLSI circuits against soft errors. The study covers a wide …
Array-Based On-Chip Hardware Monitors for Statistically Efficient Integrated Circuit Reliability Characterization
N Pande - 2020 - search.proquest.com
The miniaturization of feature sizes with every technology generation in accordance with
Moore's Law coupled with the innovations in the transistor design have resulted in a …
Moore's Law coupled with the innovations in the transistor design have resulted in a …