Gallium nitride vertical power devices on foreign substrates: A review and outlook

Y Zhang, A Dadgar, T Palacios - Journal of Physics D: Applied …, 2018 - iopscience.iop.org
Vertical gallium nitride (GaN) power devices have attracted increased attention due to their
superior high-voltage and high-current capacity as well as easier thermal management than …

The roles of structural imperfections in InGaN-based blue light-emitting diodes and laser diodes

S Nakamura - Science, 1998 - science.org
REVIEW High-efficiency light-emitting diodes emitting amber, green, blue, and ultraviolet
light have been obtained through the use of an InGaN active layer instead of a GaN active …

Two-dimensional electron gases induced by spontaneous and piezoelectric polarization charges in N-and Ga-face AlGaN/GaN heterostructures

O Ambacher, J Smart, JR Shealy… - Journal of applied …, 1999 - pubs.aip.org
Carrier concentration profiles of two-dimensional electron gases are investigated in wurtzite,
Ga-face Al x Ga 1− x N/GaN/Al x Ga 1− x N and N-face GaN/Al x Ga 1− x N/GaN …

Two dimensional electron gases induced by spontaneous and piezoelectric polarization in undoped and doped AlGaN/GaN heterostructures

O Ambacher, B Foutz, J Smart, JR Shealy… - Journal of applied …, 2000 - pubs.aip.org
Two dimensional electron gases in Al x Ga 1− x N/GaN based heterostructures, suitable for
high electron mobility transistors, are induced by strong polarization effects. The sheet …

[BOK][B] Handbook of nitride semiconductors and devices, Materials Properties, Physics and Growth

H Morkoç - 2009 - books.google.com
The three volumes of this handbook treat the fundamentals, technology and nanotechnology
of nitride semiconductors with an extraordinary clarity and depth. They present all the …

GaN: Processing, defects, and devices

SJ Pearton, JC Zolper, RJ Shul, F Ren - Journal of applied physics, 1999 - pubs.aip.org
The role of extended and point defects, and key impurities such as C, O, and H, on the
electrical and optical properties of GaN is reviewed. Recent progress in the development of …

Wet etching of GaN, AlN, and SiC: a review

D Zhuang, JH Edgar - Materials Science and Engineering: R: Reports, 2005 - Elsevier
The wet etching of GaN, AlN, and SiC is reviewed including conventional etching in
aqueous solutions, electrochemical etching in electrolytes and defect-selective chemical …

Integration of III-V lasers on Si for Si photonics

M Tang, JS Park, Z Wang, S Chen, P Jurczak… - Progress in Quantum …, 2019 - Elsevier
Abstract Development of Si photonic integrated circuits (PICs) has been impeded due to lack
of efficient Si-based light-emitting sources. Because of their indirect bandgap, bulk Ge and …

High electron mobility of epitaxial ZnO thin films on -plane sapphire grown by multistep pulsed-laser deposition

EM Kaidashev, M Lorenz, H Von Wenckstern… - Applied Physics …, 2003 - pubs.aip.org
A multistep pulsed-laser deposition (PLD) process is presented for epitaxial, nominally
undoped ZnO thin films of total thickness of 1 to 2 μm on c-plane sapphire substrates. We …

The road ahead for ultrawide bandgap solar-blind UV photodetectors

A Kalra, UU Muazzam, R Muralidharan… - Journal of Applied …, 2022 - pubs.aip.org
This Perspective seeks to understand and assess why ultrawide bandgap (UWBG)
semiconductor-based deep-UV photodetectors have not yet found any noticeable presence …