A Linear Feedback Shift Register (LFSR) is used to generate Pseudo random sequences of
bits which can be used in testing a logical circuit. In this work a Test Pattern Generator is …

Pseudo random sequences are used in testing a logical circuit which can be generated from
Linear Feedback Shift Register (LFSR). The proposed pattern generator can work both as …

Data security has been a major concern as that of the faster processing of data. As the
capability of data processing is being evolved, the attacks on these devices for the extraction …

This paper presents a Verilog-based design and comparative analysis of Linear Feedback
Shift Registers (LFSRs) for VLSI testing. Various LFSR types, such as Galois, Bit Swap** …

VLSI is the process of integrating thousands of transistors into a single chip. VLSI design is
mainly used to minimize the interconnecting fabrics area. Among the most extensively …

Low power is applied while designing a chip and it is the important challenge faced by VLSI
designer. Interconnections and internal parameters of bulk connections will consume …

The VLSI circuits must be tested, as testing VLSI circuits presents numerous difficulties in
terms of area overhead, power, and speed. One way for testing a complex architecture of …

Memories occupy a larger portion of the die area in deep submicron technology. Testing
such memories is extremely important in the manufacturing process. Minimizing the test …

VLSI circuits entitle various challenges in terms of latency, area overhead, and power.
Testing a complex circuit of VLSI design, Low power test pattern generation is a critical …

Pseudo Random Number Generators are widely used in VLSI Design as Test Pattern
Generators for testing of digital circuits in a BIST system. The test pattern sequence …