Nanosystems, edge computing, and the next generation computing systems
A Passian, N Imam - Sensors, 2019 - mdpi.com
It is widely recognized that nanoscience and nanotechnology and their subfields, such as
nanophotonics, nanoelectronics, and nanomechanics, have had a tremendous impact on …
nanophotonics, nanoelectronics, and nanomechanics, have had a tremendous impact on …
DNN engine: A 28-nm timing-error tolerant sparse deep neural network processor for IoT applications
This paper presents a 28-nm system-on-chip (SoC) for Internet of things (IoT) applications
with a programmable accelerator design that implements a powerful fully connected deep …
with a programmable accelerator design that implements a powerful fully connected deep …
Near-Threshold Wide-Voltage Design Review
Y Zhao, J Yang, C Chen, W Shan, P Cao… - Tsinghua Science …, 2023 - ieeexplore.ieee.org
This paper presents a comprehensive review of near-threshold wide-voltage designs on
memory, resilient logic designs, low voltage Radio Frequency (RF) circuits, and timing …
memory, resilient logic designs, low voltage Radio Frequency (RF) circuits, and timing …
Margin elimination through timing error detection in a near-threshold enabled 32-bit microcontroller in 40-nm CMOS
This paper presents a near-threshold operating voltage timing error detecting 32-bit
microcontroller system. The lightweight in situ error detection and correction technique uses …
microcontroller system. The lightweight in situ error detection and correction technique uses …
Design margin reduction through completion detection in a 28-nm near-threshold DSP processor
R Uytterhoeven, W Dehaene - IEEE Journal of Solid-State …, 2021 - ieeexplore.ieee.org
This article presents a timing error detection and correction (EDaC) technique optimized for
near-/sub-threshold operation to recover energy lost in the conventional signoff margins …
near-/sub-threshold operation to recover energy lost in the conventional signoff margins …
Radiation tolerant multi-bit flip-flop system with embedded timing pre-error sensing
A Jain, AM Veggetti, D Crippa… - IEEE Journal of Solid …, 2022 - ieeexplore.ieee.org
This article presents the design, implementation methodology, and validation of a multi-bit
flip-flop (FF) system that provides tolerance against single-event upsets (SEUs) and single …
flip-flop (FF) system that provides tolerance against single-event upsets (SEUs) and single …
Boosting microprocessor efficiency: Circuit-and workload-aware assessment of timing errors
Aggressive technology scaling and increased static and dynamic variability caused by
process, temperature, voltage, and aging effects make nanometer circuits prone to timing …
process, temperature, voltage, and aging effects make nanometer circuits prone to timing …
Beyond eliminating timing margin: An efficient and reliable negative margin timing error detection for neural network accelerator without accuracy loss
Z Shen, W Shan, Y Du, Z Li… - IEEE Journal of Solid-State …, 2022 - ieeexplore.ieee.org
Resilient circuits with timing error detection and correction (EDAC) can eliminate the excess
timing margin but suffer from miss detection risk due to inactivation of the critical paths. We …
timing margin but suffer from miss detection risk due to inactivation of the critical paths. We …
DSC-TRCP: Dynamically self-calibrating tunable replica critical paths based timing monitoring for variation resilient circuits
In situ timing monitoring of critical paths (CPs) can help eliminate the excess timing margin
but suffer from miss detection risk because the CPs might not be activated. However, indirect …
but suffer from miss detection risk because the CPs might not be activated. However, indirect …
Low-power variation-aware cores based on dynamic data-dependent bitwidth truncation
I Tsiokanos, L Mukhanov… - … Design, Automation & …, 2019 - ieeexplore.ieee.org
Increasing variability of transistor parameters in nanoscale era renders modern circuits
prone to timing failures. To address such failures, designers adopt pessimistic timing/voltage …
prone to timing failures. To address such failures, designers adopt pessimistic timing/voltage …