Three-dimensional detection and quantification of defects in SiC by optical coherence tomography

P Ma, J Ni, J Sun, X Zhang, J Li, H Chen - Applied Optics, 2020 - opg.optica.org
Silicon carbide (SiC) is widely used in high power electronic devices. However, defects on
the SiC significantly reduce the yield and decrease the performance of SiC. Accurate …

Short Circuit Behavior of SiC MOSFETs

B Kakarla - 2021 - research-collection.ethz.ch
Silicon carbide (SiC) technology is evolving as a promising alternative to legacy silicon-
based devices for energy-efficient power electronics applications. However, under extreme …

Deep levels characterizations in SiC to optimize high voltage devices

T Zhang - 2018 - theses.hal.science
Due to the increasing appeal to the high voltage, high temperature and high fre-quency
applications, Silicon Carbide (SiC) is continuing attracting world's attention as one of the …

Defect Characterization and Reliability effect on 4H-SiC PowerMOSFET

L Anoldo - 2023 - tesidottorato.depositolegale.it
Silicon carbide is a wide-band gap semiconductor material which became the most
desirable candidate for automotive applications making power transistors with high power …

[PDF][PDF] Study of Sic-Based Neutron Detector for Applications in The Harsh Environment of Fast Reactors

S TRIPATHI - 2019 - hbni.ac.in
The neutron is a subatomic neutral particle which makes it pivotal for a variety of
applications. For instance, neutrons play key role in neutron scattering experiments for …

SEU Study of Wideband Heterostructure Diode for Particle Detection

US Patankar, A Koel - 2021 IEEE International Conference on …, 2021 - ieeexplore.ieee.org
Single event upset simulation performed for radiation study over the device by studying
ionized current generation. In this paper, we are discussing the investigation of n-type SiC …

Numerical Simulations of wideband SiC NN Heterostructure Diode

US Patankar, A Koel, T Pard - 2020 IEEE Latin America …, 2020 - ieeexplore.ieee.org
Homogeneity and heterogeneity are one of the critically studied and implementable
concepts, become vital constituents in develo** advanced electronic devices. In …

[CITATION][C] Caractérisations des défauts profonds du SiC et pour l'optimisation des performances des composants haute tension

JGPU TARTARIN, JPUU BI - 2018 - INSA Lyon