Structural color generation: from layered thin films to optical metasurfaces

D Wang, Z Liu, H Wang, M Li, LJ Guo, C Zhang - Nanophotonics, 2023 - degruyter.com
Recent years have witnessed a rapid development in the field of structural coloration, colors
generated from the interaction of nanostructures with light. Compared to conventional color …

Photoacoustic Characterization of TiO2 Thin-Films Deposited on Silicon Substrate Using Neural Networks

KL Djordjević, DK Markushev, MN Popović, MV Nesić… - Materials, 2023 - mdpi.com
In this paper, the possibility of determining the thermal, elastic and geometric characteristics
of a thin TiO2 film deposited on a silicon substrate, with a thickness of 30 μm, in the …

The growth mechanism and properties of Bi2212 thin films on miscut substrates by sol-gel method

X Zhao, H Zhou, Y Qi, X Lu, M Sun, W Wei, D Ma… - Colloids and Surfaces A …, 2024 - Elsevier
A sol-gel methodology is employed to prepare Bi2212 thin films on single crystal LaAlO 3
miscut substrates with nominal tilt angles of 0°, 5°, 10°, and 15°. The study focuses on …

Intensity shift correction for thin film optical parameter determination

L Fan, J Ye, A Jiang, J Zhao, M Zhao, H Yin, L Shi - Thin Solid Films, 2024 - Elsevier
In recent years, many approaches have been proposed to extract optical parameters from
the spectrum of thin films and have been rapidly adopted in scientific research and industrial …

Super-resolution 3D tomography of vector near-fields in dielectric resonators

B Zhu, Q Cai, Y Liu, S Zhang, W Liu, Q He… - arxiv preprint arxiv …, 2024 - arxiv.org
All-dielectric optical resonators, exhibiting exotic near-field distributions upon excitations,
have emerged as low-loss, versatile and highly adaptable components in nanophotonic …

Smart ellipsometry with physics-informed deep learning

S Liu, X Chen, S Liu - 2023 - researchsquare.com
Ellipsometry is a century-old optical measurement technique extensively used to determine
thicknesses and optical constants of thin films. Nevertheless, as ellipsometry is essentially …

Super-resolution 3D Tomography of Vector Near-fields in Dielectric Optical Nano-resonators

B Zhu, Q Cai, Y Liu, S Zhang, W Liu, L Zhou - 2024 - researchsquare.com
All-dielectric optical nano-resonators, exhibiting exotic near-field distributions upon
excitations, have emerged as low-loss, versatile and highly adaptable components in …

Propagation of light near the band edge in one-dimensional multilayers

Y Tang, L Fan, Y Zhang, T Li, T Shen, L Shi - Chinese Physics B, 2023 - iopscience.iop.org
Optical systems offer rich modulation in light propagation, but sufficient quantitative
descriptions lack when highly complex structures are considered since practical structures …

超精密**面光学元件检测技术

周永昊, 常林, 何婷婷, 于瀛洁 - 自然杂志, 2023 - nature.shu.edu.cn
超精密**面光学元件检测技术 Page 1 157 第45 卷第3 期■专题综述 超精密光学元件是决定先进
制造领域高端 装备性能的核心部件,光学元件检测技术与仪器 装备是实现高质量光学元件制造的 …

Research on measurement technology of ultra-precision planar optics

Z Yonghao, C Lin, HE Tingting… - Chinese Journal of …, 2023 - nature.shu.edu.cn
Ultra-precision optics are the core components that determine the performance of high-end
equipment and are widely used in advanced fields such as large scientific devices and …