Scanning probe microscopy

K Bian, C Gerber, AJ Heinrich, DJ Müller… - Nature Reviews …, 2021 - nature.com
Scanning probe microscopy (SPM), a key invention in nanoscience, has by now been
extended to a wide spectrum of basic and applied fields. Its application to basic science led …

In situ analytical techniques for battery interface analysis

AM Tripathi, WN Su, BJ Hwang - Chemical Society Reviews, 2018 - pubs.rsc.org
Lithium-ion batteries, simply known as lithium batteries, are distinct among high energy
density charge-storage devices. The power delivery of batteries depends upon the …

Single-crystalline van der Waals layered dielectric with high dielectric constant

C Zhang, T Tu, J Wang, Y Zhu, C Tan, L Chen, M Wu… - Nature materials, 2023 - nature.com
The scaling of silicon-based transistors at sub-ten-nanometre technology nodes faces
challenges such as interface imperfection and gate current leakage for an ultrathin silicon …

Electrodynamics of correlated electron materials

DN Basov, RD Averitt, D Van Der Marel, M Dressel… - Reviews of Modern …, 2011 - APS
Studies of the electromagnetic response of various classes of correlated electron materials
including transition-metal oxides, organic and molecular conductors, intermetallic …

Imaging quantum spin Hall edges in monolayer WTe2

Y Shi, J Kahn, B Niu, Z Fei, B Sun, X Cai… - Science …, 2019 - science.org
A two-dimensional (2D) topological insulator exhibits the quantum spin Hall (QSH) effect, in
which topologically protected conducting channels exist at the sample edges. Experimental …

Advanced atomic force microscopies and their applications in two-dimensional materials: a review

R Xu, J Guo, S Mi, H Wen, F Pang, W Ji… - Materials …, 2022 - iopscience.iop.org
Scanning probe microscopy (SPM) allows the spatial imaging, measurement, and
manipulation of nano and atomic scale surfaces in real space. In the last two decades …

Johnson-noise-limited cancellation-free microwave impedance microscopy with monolithic silicon cantilever probes

JY Shan, N Morrison, SD Chen, F Wang… - Nature …, 2024 - nature.com
Microwave impedance microscopy (MIM) is an emerging scanning probe technique for
nanoscale complex permittivity map** and has made significant impacts in diverse fields …

Uncovering edge states and electrical inhomogeneity in MoS2 field-effect transistors

D Wu, X Li, L Luan, X Wu, W Li, MN Yogeesh… - Proceedings of the …, 2016 - pnas.org
The understanding of various types of disorders in atomically thin transition metal
dichalcogenides (TMDs), including dangling bonds at the edges, chalcogen deficiencies in …

Far infrared synchrotron near-field nanoimaging and nanospectroscopy

O Khatib, HA Bechtel, MC Martin, MB Raschke… - ACS …, 2018 - ACS Publications
Scattering scanning near-field optical microscopy (s-SNOM) has emerged as a powerful
imaging and spectroscopic tool for investigating nanoscale heterogeneities in biology …

Modeling and characterization of a cantilever-based near-field scanning microwave impedance microscope

K Lai, W Kundhikanjana, M Kelly… - Review of scientific …, 2008 - pubs.aip.org
This paper presents a detailed modeling and characterization of a microfabricated cantilever-
based scanning microwave probe with separated excitation and sensing electrodes. Using …