Cross training efficiency and flexibility with process change

D A. Nembhard - International Journal of Operations & Production …, 2014 - emerald.com
Purpose–The purpose of this paper is to investigate the tradeoffs between efficiency and
flexibility in production processes involve a cross-trained workforce. The study quantifies …

FICS PCB X-ray: A dataset for automated printed circuit board inter-layers inspection

D Mehta, J True, OP Dizon-Paradis… - Cryptology ePrint …, 2022 - eprint.iacr.org
Advancements in computer vision and machine learning breakthroughs over the years have
paved the way for automated X-ray inspection (AXI) of printed circuit boards (PCBs) …

On the interaction between measurement strategy and control performance in semiconductor manufacturing

AJ Su, CC Yu, BA Ogunnaike - Journal of Process Control, 2008 - Elsevier
Manufacturing in the high revenue semiconductor industry involves a highly capital intensive
process consisting of more than 300 steps. To ensure stable process operation and …

Smart sampling for risk reduction and delay optimisation

M Sahnoun, B Bettayeb, M Tollenaere… - 2012 IEEE …, 2012 - ieeexplore.ieee.org
Semiconductor manufacturing processes are very long and complex. They need several
hundreds individual steps to produce the final component. Early detection of potential …

[PDF][PDF] Data Engineering for improved process control in the semiconductor industry

F Gaggl - 2024 - netlibrary.aau.at
The semiconductor manufacturing industry is growing at an unprecedented rate creating the
need for efficient data engineering solutions enabling data-driven decision-making to …

Diagnostic factory productivity metrics

K MUTHIAH, M NATHAN - 2003 - rave.ohiolink.edu
In order to improve manufacturing productivity, companies have developed new technology
and adopted new manufacturing paradigms. However, they often overlook the importance of …

Analytical model for optimal inspection frequency with consideration of setup inspections

K Berger, H Bar-Gera, A Kalir… - 2007 IEEE International …, 2007 - ieeexplore.ieee.org
Inspections are an essential component of the production process in semiconductor
fabrication facilities. Inspection frequency influences the process yield as well as the …

Performance of workstation with offline and integrated metrology

AJ de Ron, JE Rooda - IEEE transactions on semiconductor …, 2007 - ieeexplore.ieee.org
One of the present developments in the semiconductor industry is integration of metrology
tools in the main process tool, instead of measuring wafers stand-alone, ie, at an offline …

Metrology delay time reduction in lithography with an enhanced AMHS using local FOUP buffering

V Shah, E Englhardt, S Koshti… - The 17th Annual SEMI …, 2006 - ieeexplore.ieee.org
An enhanced automated material handling system (AMHS) that uses a local FOUP buffer at
each tool is presented as a method of enabling lot size reduction and parallel metrology …

[KSIĄŻKA][B] Simulationsgestützte untersuchung von logistischen optimierungsstrategien bei Halbleiter-fertigungsprozessen

M Pfeffer - 2012 - search.proquest.com
Die Halbleiterfertigung ist ein äußerst komplexer Wertschöpfungsprozess, der aufgrund
eines schnell wechselnden Marktes und der immensen Investitionskosten unter extremen …