Cross training efficiency and flexibility with process change
D A. Nembhard - International Journal of Operations & Production …, 2014 - emerald.com
Purpose–The purpose of this paper is to investigate the tradeoffs between efficiency and
flexibility in production processes involve a cross-trained workforce. The study quantifies …
flexibility in production processes involve a cross-trained workforce. The study quantifies …
FICS PCB X-ray: A dataset for automated printed circuit board inter-layers inspection
Advancements in computer vision and machine learning breakthroughs over the years have
paved the way for automated X-ray inspection (AXI) of printed circuit boards (PCBs) …
paved the way for automated X-ray inspection (AXI) of printed circuit boards (PCBs) …
On the interaction between measurement strategy and control performance in semiconductor manufacturing
AJ Su, CC Yu, BA Ogunnaike - Journal of Process Control, 2008 - Elsevier
Manufacturing in the high revenue semiconductor industry involves a highly capital intensive
process consisting of more than 300 steps. To ensure stable process operation and …
process consisting of more than 300 steps. To ensure stable process operation and …
Smart sampling for risk reduction and delay optimisation
Semiconductor manufacturing processes are very long and complex. They need several
hundreds individual steps to produce the final component. Early detection of potential …
hundreds individual steps to produce the final component. Early detection of potential …
[PDF][PDF] Data Engineering for improved process control in the semiconductor industry
F Gaggl - 2024 - netlibrary.aau.at
The semiconductor manufacturing industry is growing at an unprecedented rate creating the
need for efficient data engineering solutions enabling data-driven decision-making to …
need for efficient data engineering solutions enabling data-driven decision-making to …
Diagnostic factory productivity metrics
K MUTHIAH, M NATHAN - 2003 - rave.ohiolink.edu
In order to improve manufacturing productivity, companies have developed new technology
and adopted new manufacturing paradigms. However, they often overlook the importance of …
and adopted new manufacturing paradigms. However, they often overlook the importance of …
Analytical model for optimal inspection frequency with consideration of setup inspections
Inspections are an essential component of the production process in semiconductor
fabrication facilities. Inspection frequency influences the process yield as well as the …
fabrication facilities. Inspection frequency influences the process yield as well as the …
Performance of workstation with offline and integrated metrology
AJ de Ron, JE Rooda - IEEE transactions on semiconductor …, 2007 - ieeexplore.ieee.org
One of the present developments in the semiconductor industry is integration of metrology
tools in the main process tool, instead of measuring wafers stand-alone, ie, at an offline …
tools in the main process tool, instead of measuring wafers stand-alone, ie, at an offline …
Metrology delay time reduction in lithography with an enhanced AMHS using local FOUP buffering
V Shah, E Englhardt, S Koshti… - The 17th Annual SEMI …, 2006 - ieeexplore.ieee.org
An enhanced automated material handling system (AMHS) that uses a local FOUP buffer at
each tool is presented as a method of enabling lot size reduction and parallel metrology …
each tool is presented as a method of enabling lot size reduction and parallel metrology …
[KSIĄŻKA][B] Simulationsgestützte untersuchung von logistischen optimierungsstrategien bei Halbleiter-fertigungsprozessen
M Pfeffer - 2012 - search.proquest.com
Die Halbleiterfertigung ist ein äußerst komplexer Wertschöpfungsprozess, der aufgrund
eines schnell wechselnden Marktes und der immensen Investitionskosten unter extremen …
eines schnell wechselnden Marktes und der immensen Investitionskosten unter extremen …