New generation deep learning for video object detection: A survey

L Jiao, R Zhang, F Liu, S Yang, B Hou… - IEEE Transactions on …, 2021 - ieeexplore.ieee.org
Video object detection, a basic task in the computer vision field, is rapidly evolving and
widely used. In recent years, deep learning methods have rapidly become widespread in the …

Object scene flow for autonomous vehicles

M Menze, A Geiger - … of the IEEE conference on computer …, 2015 - openaccess.thecvf.com
This paper proposes a novel model and dataset for 3D scene flow estimation with an
application to autonomous driving. Taking advantage of the fact that outdoor scenes often …

Digital circuit design challenges and opportunities in the era of nanoscale CMOS

BH Calhoun, Y Cao, X Li, K Mai… - Proceedings of the …, 2008 - ieeexplore.ieee.org
Well-designed circuits are one key ldquoinsulatingrdquo layer between the increasingly
unruly behavior of scaled complementary metal-oxide-semiconductor devices and the …

Thermal modeling, analysis, and management in VLSI circuits: Principles and methods

M Pedram, S Nazarian - Proceedings of the IEEE, 2006 - ieeexplore.ieee.org
The growing packing density and power consumption of very large scale integration (VLSI)
circuits have made thermal effects one of the most important concerns of VLSI designers …

Statistical timing analysis: From basic principles to state of the art

D Blaauw, K Chopra, A Srivastava… - IEEE transactions on …, 2008 - ieeexplore.ieee.org
Static-timing analysis (STA) has been one of the most pervasive and successful analysis
engines in the design of digital circuits for the last 20 years. However, in recent years, the …

Interpolatory projection methods for parameterized model reduction

U Baur, C Beattie, P Benner, S Gugercin - SIAM Journal on Scientific …, 2011 - SIAM
We provide a unifying projection-based framework for structure-preserving interpolatory
model reduction of parameterized linear dynamical systems, ie, systems having a structured …

[BOOK][B] System-on-chip test architectures: nanometer design for testability

LT Wang, CE Stroud, NA Touba - 2010 - books.google.com
Modern electronics testing has a legacy of more than 40 years. The introduction of new
technologies, especially nanometer technologies with 90nm or smaller geometry, has …

Stochastic testing method for transistor-level uncertainty quantification based on generalized polynomial chaos

Z Zhang, TA El-Moselhy, IM Elfadel… - IEEE Transactions on …, 2013 - ieeexplore.ieee.org
Uncertainties have become a major concern in integrated circuit design. In order to avoid the
huge number of repeated simulations in conventional Monte Carlo flows, this paper presents …

[BOOK][B] Statistical analysis and optimization for VLSI: Timing and power

A Srivastava, D Sylvester, D Blaauw - 2006 - books.google.com
Statistical Analysis and Optimization For VLSI: Timing and Power is a state-of-the-art book
on the newly emerging field of statistical computer-aided design (CAD) tools. The very latest …

Why quasi-Monte Carlo is better than Monte Carlo or Latin hypercube sampling for statistical circuit analysis

A Singhee, RA Rutenbar - IEEE Transactions on Computer …, 2010 - ieeexplore.ieee.org
At the nanoscale, no circuit parameters are truly deterministic; most quantities of practical
interest present themselves as probability distributions. Thus, Monte Carlo techniques …