Optical beam deflection (OBD) is the most prevalent method for measuring cantilever
deflections in atomic force microscopy (AFM), mainly due to its excellent noise performance …

Designed for advanced undergraduate students and as a useful reference book for
materials researchers, Physical Properties of Materials, Third Edition establishes the …

Atomic force microscope (AFM) cantilevers with integrated actuation and sensing provide
several distinct advantages over conventional cantilever instrumentation. These include …

Fundamental contact mechanics models concerning the interaction of an axisymmetric
indenter and an elastic half-space are usually employed in atomic force microscopy (AFM) …

Physical intelligence (PI) is an emerging research field using new multi-functional smart
materials in mechatronic designs. On the microscopic scale, PI principles give rise to …

Microscopy instruments are important in nano-technology research for imaging of nanoscale
phenomena. Among such tools is the atomic force microscope (AFM) for nanoscale imaging …

Atomic force microscopy (AFM) is an important tool in nanotechnology. This method makes it
possible to observe nanoscopic surfaces beyond the resolution of light microscopy. In order …

Atomic force microscopes (AFMs) are ubiquitous in research laboratories and have recently
been priced for use in teaching laboratories. Here, we review several AFM platforms and …

Gaussian fluctuations (or Gaussian noise) appear in almost all measurements in physics.
Here, a concise and self-contained introduction to thermal Gaussian noise is presented. Our …

This paper presents the methodology to measure the precise deflection of microcantilever in
an optical pickup head based atomic force microscopy. In this paper, three types of …