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Hafnia-Based Ferroelectric Memory: Device Physics Strongly Correlated with Materials Chemistry
Hafnia-based ferroelectrics and their semiconductor applications are reviewed, focusing on
next-generation dynamic random-access-memory (DRAM) and Flash. The challenges of …
next-generation dynamic random-access-memory (DRAM) and Flash. The challenges of …
Can Interface Layer be Really Free for HfxZr1-xO2 Based Ferroelectric Field-Effect Transistors With Oxide Semiconductor Channel?
T Cui, D Chen, Y Dong, Y Fan, Z Yao… - IEEE Electron …, 2024 - ieeexplore.ieee.org
The HfxZr1− xO2 (HZO) based ferroelectric field-effect transistors (FeFETs) with oxide
semiconductor channel have been proposed to have the potential of interface layer (IL) free …
semiconductor channel have been proposed to have the potential of interface layer (IL) free …
Role of nitrogen in suppressing interfacial states generation and improving endurance in ferroelectric field-effect transistors
S Dai, S Li, S Xu, F Tian, J Chai, J Duan… - … on Electron Devices, 2024 - ieeexplore.ieee.org
In this study, we investigate the impact of nitridation in Hf Zr O2-based ferroelectric field-
effect transistors (FeFETs) with a SiON interfacial layer (IL). We fabricated the SiON IL using …
effect transistors (FeFETs) with a SiON interfacial layer (IL). We fabricated the SiON IL using …
Understanding HZO thickness scaling in Si FeFETs: Low operating voltage, fast wake-up, and suppressed charge trap**
Z Cai, K Toprasertpong, Z Liu… - … on Electron Devices, 2024 - ieeexplore.ieee.org
Hf0. 5Zr0. 5O2 (HZO)-based ferroelectric field effect transistor (FeFET) has been recognized
as a promising nonvolatile memory due to its excellent scalability and CMOS process …
as a promising nonvolatile memory due to its excellent scalability and CMOS process …
In-depth understanding of nitridation-induced endurance enhancement in FeFETs: defect properties and dynamics characterized by nonradiative multi-phonon model
Y Huang, H Yuan, T Gong, Y Wang… - … on Electron Devices, 2024 - ieeexplore.ieee.org
In this work, by analyzing the properties and dynamics of defects in detail, the role of
nitrogen in improving the endurance of ferroelectric field-effect transistors (FeFETs) is …
nitrogen in improving the endurance of ferroelectric field-effect transistors (FeFETs) is …
Investigation of Charge Trap** Induced Trap Generation in Si FeFET With Ferroelectric Hf0.5Zr0.5O2
X Jia, J Chai, J Duan, X Sun, X Shao… - … on Electron Devices, 2024 - ieeexplore.ieee.org
We investigate charge trap** induced trap generation in Si ferroelectric field-effect
transistor (FeFET) with ferroelectric Hf0. 5Zr0. 5O2/SiO2 gate stacks by split–measurement …
transistor (FeFET) with ferroelectric Hf0. 5Zr0. 5O2/SiO2 gate stacks by split–measurement …
Hybrid-FE-Layer FeFET with high linearity and endurance toward on-chip CIM by array demonstration
Analog weight cells based on ferroelectric field-effect transistors (FeFETs) are promising for
fast and energy efficient compute-in-memory (CIM) accelerators, yet their on-chip training is …
fast and energy efficient compute-in-memory (CIM) accelerators, yet their on-chip training is …
Grain size reduction of ferroelectric HZO enabled by solid phase epitaxy (SPE): Working principle, experimental demonstration, and theoretical understanding
In this work, we introduce an effective and versatile technique employing replacement
electrode solid phase epitaxy (SPE) to realize grain size reduction of the Zr-doped HfO2 …
electrode solid phase epitaxy (SPE) to realize grain size reduction of the Zr-doped HfO2 …
A 1T1M programmable artificial spiking neuron via the integration of FeFET and NbOx Mott memristor
S Zhao, CY Han, F Tian, Y Yuan, J Chai… - IEEE Electron …, 2024 - ieeexplore.ieee.org
In this study, we present a one-transistor-one-memristor (1T1M) programmable artificial
spiking neuron, achieved through the integration of a Hf0. 5 Zr0. 5 O2 ferroelectric transistor …
spiking neuron, achieved through the integration of a Hf0. 5 Zr0. 5 O2 ferroelectric transistor …
[HTML][HTML] Fatigue of Ferroelectric Field Effect Transistor: Mechanisms and Optimization Strategies
Y Song, P Jiang, P Xu, X Peng, Q Wei, Q Yan… - Journal of …, 2025 - jos.ac.cn
The novel HfO 2-based ferroelectric field effect transistor (FeFET) is considered a promising
candidate for next-generation nonvolatile memory (NVM). However, a series of reliability …
candidate for next-generation nonvolatile memory (NVM). However, a series of reliability …