Hafnia-Based Ferroelectric Memory: Device Physics Strongly Correlated with Materials Chemistry

H Choi, YH Cho, SH Kim, K Yang… - The Journal of Physical …, 2024 - ACS Publications
Hafnia-based ferroelectrics and their semiconductor applications are reviewed, focusing on
next-generation dynamic random-access-memory (DRAM) and Flash. The challenges of …

Can Interface Layer be Really Free for HfxZr1-xO2 Based Ferroelectric Field-Effect Transistors With Oxide Semiconductor Channel?

T Cui, D Chen, Y Dong, Y Fan, Z Yao… - IEEE Electron …, 2024 - ieeexplore.ieee.org
The HfxZr1− xO2 (HZO) based ferroelectric field-effect transistors (FeFETs) with oxide
semiconductor channel have been proposed to have the potential of interface layer (IL) free …

Role of nitrogen in suppressing interfacial states generation and improving endurance in ferroelectric field-effect transistors

S Dai, S Li, S Xu, F Tian, J Chai, J Duan… - … on Electron Devices, 2024 - ieeexplore.ieee.org
In this study, we investigate the impact of nitridation in Hf Zr O2-based ferroelectric field-
effect transistors (FeFETs) with a SiON interfacial layer (IL). We fabricated the SiON IL using …

Understanding HZO thickness scaling in Si FeFETs: Low operating voltage, fast wake-up, and suppressed charge trap**

Z Cai, K Toprasertpong, Z Liu… - … on Electron Devices, 2024 - ieeexplore.ieee.org
Hf0. 5Zr0. 5O2 (HZO)-based ferroelectric field effect transistor (FeFET) has been recognized
as a promising nonvolatile memory due to its excellent scalability and CMOS process …

In-depth understanding of nitridation-induced endurance enhancement in FeFETs: defect properties and dynamics characterized by nonradiative multi-phonon model

Y Huang, H Yuan, T Gong, Y Wang… - … on Electron Devices, 2024 - ieeexplore.ieee.org
In this work, by analyzing the properties and dynamics of defects in detail, the role of
nitrogen in improving the endurance of ferroelectric field-effect transistors (FeFETs) is …

Investigation of Charge Trap** Induced Trap Generation in Si FeFET With Ferroelectric Hf0.5Zr0.5O2

X Jia, J Chai, J Duan, X Sun, X Shao… - … on Electron Devices, 2024 - ieeexplore.ieee.org
We investigate charge trap** induced trap generation in Si ferroelectric field-effect
transistor (FeFET) with ferroelectric Hf0. 5Zr0. 5O2/SiO2 gate stacks by split–measurement …

Hybrid-FE-Layer FeFET with high linearity and endurance toward on-chip CIM by array demonstration

Y Zhou, H Shao, R Zhu, W Luo… - IEEE Electron …, 2023 - ieeexplore.ieee.org
Analog weight cells based on ferroelectric field-effect transistors (FeFETs) are promising for
fast and energy efficient compute-in-memory (CIM) accelerators, yet their on-chip training is …

Grain size reduction of ferroelectric HZO enabled by solid phase epitaxy (SPE): Working principle, experimental demonstration, and theoretical understanding

D Zhang, J Wu, Q Kong, Z Zheng… - … on Electron Devices, 2023 - ieeexplore.ieee.org
In this work, we introduce an effective and versatile technique employing replacement
electrode solid phase epitaxy (SPE) to realize grain size reduction of the Zr-doped HfO2 …

A 1T1M programmable artificial spiking neuron via the integration of FeFET and NbOx Mott memristor

S Zhao, CY Han, F Tian, Y Yuan, J Chai… - IEEE Electron …, 2024 - ieeexplore.ieee.org
In this study, we present a one-transistor-one-memristor (1T1M) programmable artificial
spiking neuron, achieved through the integration of a Hf0. 5 Zr0. 5 O2 ferroelectric transistor …

[HTML][HTML] Fatigue of Ferroelectric Field Effect Transistor: Mechanisms and Optimization Strategies

Y Song, P Jiang, P Xu, X Peng, Q Wei, Q Yan… - Journal of …, 2025 - jos.ac.cn
The novel HfO 2-based ferroelectric field effect transistor (FeFET) is considered a promising
candidate for next-generation nonvolatile memory (NVM). However, a series of reliability …