Dependable dnn accelerator for safety-critical systems: A review on the aging perspective

I Moghaddasi, S Gorgin, JA Lee - IEEE Access, 2023 - ieeexplore.ieee.org
In the modern era, artificial intelligence (AI) and deep learning (DL) seamlessly integrate into
various spheres of our daily lives. These cutting-edge disciplines have given rise to …

Interaction of Negative Bias Instability and Self-Heating Effect on Threshold Voltage and SRAM (Static Random-Access Memory) Stability of Nanosheet Field-Effect …

X Li, Y Shao, Y Wang, F Liu, F Kuang, Y Zhuang, C Li - Micromachines, 2024 - mdpi.com
In this paper, we investigate the effects of negative bias instability (NBTI) and self-heating
effect (SHE) on threshold voltage in NSFETs. To explore accurately the interaction between …

Reliability-aware quantization for anti-aging NPUs

S Salamin, G Zervakis, O Spantidi… - … , Automation & Test …, 2021 - ieeexplore.ieee.org
Transistor aging is one of the major concerns that challenges designers in advanced
technologies. It profoundly degrades the reliability of circuits during its lifetime as it slows …

Reliable and ultra-low power approach for designing of logic circuits

SU Haq, VK Sharma - Analog Integrated Circuits and Signal Processing, 2024 - Springer
The principal design concern in today's very large-scale integration (VLSI) industry is power
dissipation. Power dissipation in a chip rises reliability issues. Static power dissipation …

Temperature effects on BTI and soft errors in modern logic circuits

W Sootkaneung, S Howimanporn… - Microelectronics …, 2018 - Elsevier
Since thermal responses of the drive current in recent 3D FinFET and conventional planar
transistors are different, addressing performance and reliability in advanced VLSI circuits …

Neural Network-Based Control of Forced-Convection and Thermoelectric Coolers

M Akhsham, MJ Dousti, S Safari - IEEE Transactions on …, 2024 - ieeexplore.ieee.org
Thermoelectric cooling technology holds great promise as a spot-cooling solution for VLSI
circuits. Typically, it is combined with a forced convection cooler, such as a fan, to achieve …

Mitigation of Thermal Stability Concerns in FinFET Devices

E Bender, JB Bernstein, DS Boning - Electronics, 2022 - mdpi.com
Here, we developed a procedure for mitigating thermal hazards in packaged FinFET
devices. A monitoring system was installed into devices, based on self-heating impact …

Circuit-level approaches to mitigate the process variability and soft errors in finFET logic cells

AL Zimpeck - 2019 - hal.science
Process variability mitigation and radiation hardness are relevant reliability requirements as
chip manufacturing advances more in-depth into the nanometer regime. The parameter yield …

Self-Heating Effects Measured in Fully Packaged FinFET Devices

E Bender, JB Bernstein - 2021 IEEE 32nd International …, 2021 - ieeexplore.ieee.org
A unique, resource efficient method for finding the impact of Self-heating Effects (SHE) in
packaged FinFET devices is presented in this work. Device level concerns seen in reliability …

Towards Scaling Artificial Intelligence for Resilience and Robustness

A Sarmadi - 2024 - search.proquest.com
Abstract Integration of Artificial Intelligence (AI) into areas such as image classification,
speech recognition, natural language processing, and autonomous systems illustrates its …