CMOL FPGA: a reconfigurable architecture for hybrid digital circuits with two-terminalnanodevices

DB Strukov, KK Likharev - Nanotechnology, 2005 - iopscience.iop.org
This paper describes a digital logic architecture for'CMOL'hybrid circuits which combine a
semiconductor–transistor (CMOS) stack and two levels of parallel nanowires, with molecular …

CMOL: Devices, circuits, and architectures

KK Likharev, DB Strukov - Introducing Molecular Electronics, 2005 - Springer
This chapter is a brief review of the recent work on various aspects of the prospective hybrid
semiconductor/nanowire/molecular (“CMOL”) integrated circuits. The basic idea of such …

Majority multiplexing-economical redundant fault-tolerant designs for nanoarchitectures

S Roy, V Beiu - IEEE Transactions on Nanotechnology, 2005 - ieeexplore.ieee.org
Motivated by the need for economical fault-tolerant designs for nanoarchitectures, we
explore a novel multiplexing-based redundant design scheme at small (/spl les/100) and …

[LLIBRE][B] Reliability of nanoscale circuits and systems: methodologies and circuit architectures

M Stanisavljević, A Schmid, Y Leblebici - 2010 - books.google.com
This book is intended to give a general overview of reliability, faults, fault models,
nanotechnology, nanodevices, fault-tolerant architectures and reliability evaluation …

Bifurcations and fundamental error bounds for fault-tolerant computations

JB Gao, Y Qi, JAB Fortes - IEEE Transactions on …, 2005 - ieeexplore.ieee.org
In the emerging nanotechnologies, faulty components may be an integral part of a system.
For the system to be reliable, the error of the building blocks has to be smaller than a …

Comparing reliability-redundancy tradeoffs for two von Neumann multiplexing architectures

D Bhaduri, S Shukla, P Graham… - IEEE Transactions on …, 2007 - ieeexplore.ieee.org
Nanoelectronic systems are anticipated to be highly susceptible to computation and
communication noise. Interestingly, von Neumann addressed the issue of computation in the …

Identifying the worst reliability input vectors and the associated critical logic gates

W Ibrahim - IEEE Transactions on Computers, 2015 - ieeexplore.ieee.org
Scaling the CMOS devices deep into the nanorange reduces their reliability margins
significantly. Consequently, accurately calculating the reliability of digital nanocircuits is …

A novel highly reliable low-power nano architecture when von Neumann augments Kolmogorov

V Beiu - Proceedings. 15th IEEE International Conference on …, 2004 - ieeexplore.ieee.org
This work presents a novel architecture, which is both device and circuit independent. The
starting idea is that computations can be performed in three fundamentally different ways …

Optimum reliability sizing for complementary metal oxide semiconductor gates

W Ibrahim, V Beiu, A Beg - IEEE Transactions on Reliability, 2012 - ieeexplore.ieee.org
Introducing redundancy at the device-level has been proposed as the most effective way to
improve reliability. With the remarkable reliability of the complementary metal oxide …

On computing nano-architectures using unreliable nano-devices

V Beiu, W Ibrahim - Nano and Molecular Electronics Handbook, 2018 - taylorfrancis.com
This chapter will start with a brief review of nanoelectronic challenges while focusing on the
reliability challenge. One of the most recent call-to-arms [1] raises two fundamental …