System event logs have been frequently used as a valuable resource in data-driven
approaches to enhance system health and stability. A typical procedure in system log …

This book is a comprehensive guide to new DFT methods that will show the readers how to
design a testable and quality product, drive down test cost, improve product quality and …

We determine the exact power of two-prover interactive proof systems introduced by Ben-Or,
Goldwasser, Kilian, and Wigderson (1988). In this system, two all-powerful …

With the ever-increasing speed of integrated circuits, violations of the performance
specifications are becoming a major factor affecting the product quality level. The need for …

In recent years (1990) feedback set problems have been the subject of growing interest.
They have found applications in many fields, including deadlock prevention [90], program …

Your road map for meeting today's digital testing challenges Today, digital logic devices are
common in products that impact public safety, including applications in transportation and …

A new ATPG algorithm has been proposed that reduces average heat dissipation (between
successive test vectors) during test application. The objective is to permit safe and …

We develop an exact algorithm for selecting flip-flops in partial scan designs to break all
feedback cycles. The main ideas that allow us to solve this hard problem exactly for large …

In this paper we report on procedures investigated to determine flip-flops to be scanned in
partial-scan designs for sequential circuits. The main idea pursued is to derive a minimal …

We propose timing-driven test point insertion methods for a full-scan based BIST scheme
and for a partial-scan based BIST scheme, where the global flip-flop cycles have been …