Structural reliability analysis: A Bayesian perspective
Numerical methods play a dominant role in structural reliability analysis, and the goal has
long been to produce a failure probability estimate with a desired level of accuracy using a …
long been to produce a failure probability estimate with a desired level of accuracy using a …
Estimation of small failure probability using generalized subset simulation
This paper proposes a generalized subset simulation (GSS) method for estimating small
failure probability. The basic idea is to modify the failure threshold and amplify the variability …
failure probability. The basic idea is to modify the failure threshold and amplify the variability …
Efficient yield optimization for analog and SRAM circuits via Gaussian process regression and adaptive yield estimation
M Wang, W Lv, F Yang, C Yan, W Cai… - … on Computer-Aided …, 2017 - ieeexplore.ieee.org
In this paper, a Bayesian optimization approach is proposed for yield optimization of analog
and SRAM circuits. Gaussian process (GP) regression is employed to predict the yield over …
and SRAM circuits. Gaussian process (GP) regression is employed to predict the yield over …
Autoprivacy: Automated layer-wise parameter selection for secure neural network inference
Abstract Hybrid Privacy-Preserving Neural Network (HPPNN) implementing linear layers by
Homomorphic Encryption (HE) and nonlinear layers by Garbled Circuit (GC) is one of the …
Homomorphic Encryption (HE) and nonlinear layers by Garbled Circuit (GC) is one of the …
A review of bayesian methods in electronic design automation
The utilization of Bayesian methods has been widely acknowledged as a viable solution for
tackling various challenges in electronic integrated circuit (IC) design under stochastic …
tackling various challenges in electronic integrated circuit (IC) design under stochastic …
High-dimensional and multiple-failure-region importance sampling for SRAM yield analysis
M Wang, C Yan, X Li, D Zhou… - IEEE Transactions on Very …, 2016 - ieeexplore.ieee.org
The failure rate of static RAM (SRAM) cells is restricted to be extremely low to ensure
sufficient high yield for the entire chip. In addition, multiple performances of interest and …
sufficient high yield for the entire chip. In addition, multiple performances of interest and …
Fast statistical analysis of rare circuit failure events via subset simulation in high-dimensional variation space
In this paper, we propose a novel subset simulation (SUS) technique to efficiently estimate
the rare failure rate for nanoscale circuit blocks (eg, SRAM, DFF, etc.) in high-dimensional …
the rare failure rate for nanoscale circuit blocks (eg, SRAM, DFF, etc.) in high-dimensional …
Enabling high-dimensional Bayesian optimization for efficient failure detection of analog and mixed-signal circuits
With increasing design complexity and stringent robustness requirements in application
such as automotive electronics, analog and mixed-signal (AMS) verification becomes akey …
such as automotive electronics, analog and mixed-signal (AMS) verification becomes akey …
Fast and efficient high-sigma yield analysis and optimization using kernel density estimation on a bayesian optimized failure rate model
With ever-increasing transistor density in nanoscale-integrated circuits, the impact of
process variations on circuit performance and chip yield becomes dominant. To prevent …
process variations on circuit performance and chip yield becomes dominant. To prevent …
CAD for Analog/Mixed‐Signal Integrated Circuits
While digital integrated circuits (ICs) has adopted highly automated computer aided design
(CAD) tools for decades including synthesis, placement, and routing, analog, and mixed …
(CAD) tools for decades including synthesis, placement, and routing, analog, and mixed …