Probing Italy: a scanning probe microscopy storyline

F Dinelli, M Brucale, F Valle, C Ascoli, B Samorì… - Micro, 2023 - mdpi.com
Starting from the late 1980's, scanning probe microscopy has progressively diffused in Italy
until today. In this paper, we provide a brief account of the main historical events and a …

Native Silicon Oxide Properties Determined by Do**

M Della Ciana, A Kovtun, C Summonte, A Candini… - Langmuir, 2023 - ACS Publications
The physico-chemical properties of native oxide layers, spontaneously forming on crystalline
Si wafers in air, can be strictly correlated to the dopant type and do** level. In particular …

Identification of ultra-thin molecular layers atop monolayer terraces in sub-monolayer organic films with scanning probe microscopy

S Chiodini, F Dinelli, NF Martinez, S Donati, C Albonetti - Ultramicroscopy, 2022 - Elsevier
The morphology of sub-monolayer sexithiophene films has been investigated in situ and ex
situ as a function of the substrate temperature of deposition. In this thickness range …