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Probing Italy: a scanning probe microscopy storyline
Starting from the late 1980's, scanning probe microscopy has progressively diffused in Italy
until today. In this paper, we provide a brief account of the main historical events and a …
until today. In this paper, we provide a brief account of the main historical events and a …
Native Silicon Oxide Properties Determined by Do**
The physico-chemical properties of native oxide layers, spontaneously forming on crystalline
Si wafers in air, can be strictly correlated to the dopant type and do** level. In particular …
Si wafers in air, can be strictly correlated to the dopant type and do** level. In particular …
Identification of ultra-thin molecular layers atop monolayer terraces in sub-monolayer organic films with scanning probe microscopy
The morphology of sub-monolayer sexithiophene films has been investigated in situ and ex
situ as a function of the substrate temperature of deposition. In this thickness range …
situ as a function of the substrate temperature of deposition. In this thickness range …