Metal oxides for optoelectronic applications

X Yu, TJ Marks, A Facchetti - Nature materials, 2016 - nature.com
Metal oxides (MOs) are the most abundant materials in the Earth's crust and are ingredients
in traditional ceramics. MO semiconductors are strikingly different from conventional …

Electronic defects in amorphous oxide semiconductors: A review

K Ide, K Nomura, H Hosono… - physica status solidi (a), 2019 - Wiley Online Library
Amorphous oxide semiconductors (AOSs) have been commercialized since 2012 as thin‐
film transistor (TFT) backplanes in flat‐panel displays. This review first provides a brief …

Oxide semiconductor thin‐film transistors: a review of recent advances

E Fortunato, P Barquinha, R Martins - Advanced materials, 2012 - Wiley Online Library
Transparent electronics is today one of the most advanced topics for a wide range of device
applications. The key components are wide bandgap semiconductors, where oxides of …

Photo-bias instability of metal oxide thin film transistors for advanced active matrix displays

JK Jeong - Journal of Materials Research, 2013 - cambridge.org
Metal oxide optoelectronics is an emerging field that exploits the intriguing properties of the
ns orbital-derived isotropic band structure as a replacement for traditional silicon-based …

Active‐Matrix GaN µ‐LED Display Using Oxide Thin‐Film Transistor Backplane and Flip Chip LED Bonding

JG Um, DY Jeong, Y Jung, JK Moon… - Advanced Electronic …, 2019 - Wiley Online Library
A 2 in. active‐matrix light‐emitting diode (AMLED) display by integration of the micro‐LED
onto the oxide thin‐film transistor (TFT) backplane using flip chip bonding is reported. A blue …

Top interface engineering of flexible oxide thin‐film transistors by splitting active layer

S Lee, J Shin, J Jang - Advanced Functional Materials, 2017 - Wiley Online Library
The effect of active layer (amorphous indium–gallium–zinc oxide, a‐IGZO) splitting on the
performances of back‐channel‐etched (BCE) and etch‐stopper (ES) thin‐film transistors …

Hydrogen Bistability as the Origin of Photo‐Bias‐Thermal Instabilities in Amorphous Oxide Semiconductors

Y Kang, BD Ahn, JH Song, YG Mo… - Advanced Electronic …, 2015 - Wiley Online Library
Zinc‐based metal oxide semiconductors have attracted attention as an alternative to current
silicon‐based semiconductors for applications in transparent and flexible electronics …

Light/negative bias stress instabilities in indium gallium zinc oxide thin film transistors explained by creation of a double donor

P Migliorato, M Delwar Hossain Chowdhury… - Applied Physics …, 2012 - pubs.aip.org
The analysis of current-voltage (IV) and capacitance-voltage (CV) characteristics for
amorphous indium gallium zinc oxide Thin film transistors as a function of active layer …

Defects in amorphous semiconductors: The case of amorphous indium gallium zinc oxide

A de Jamblinne de Meux, G Pourtois, J Genoe… - Physical Review …, 2018 - APS
Based on a rational classification of defects in amorphous materials, we propose a simplified
model to describe intrinsic defects and hydrogen impurities in amorphous indium gallium …

As-grown crystalline InGaZnO by spray pyrolysis on a flexible substrate for a thin-film transistor with excellent stability

J Bae, A Ali, MM Islam, M Jeong, C Park… - ACS Applied Materials …, 2023 - ACS Publications
The development of low-cost, high-mobility oxide thin-film transistors (TFTs) with excellent
stability is of increasing interest. The coplanar oxide TFTs can be used for high-speed, large …