A review of recent MOSFET threshold voltage extraction methods

A Ortiz-Conde, FJG Sánchez, JJ Liou, A Cerdeira… - Microelectronics …, 2002 - Elsevier
The threshold voltage value, which is the most important electrical parameter in modeling
MOSFETs, can be extracted from either measured drain current or capacitance …

[BOOK][B] Organic field-effect transistors

Z Bao, J Locklin - 2018 - books.google.com
The remarkable development of organic thin film transistors (OTFTs) has led to their
emerging use in active matrix flat-panel displays, radio frequency identification cards, and …

Revisiting MOSFET threshold voltage extraction methods

A Ortiz-Conde, FJ García-Sánchez, J Muci… - Microelectronics …, 2013 - Elsevier
This article presents an up-to-date review of the several extraction methods commonly used
to determine the value of the threshold voltage of MOSFETs. It includes the different methods …

A review of electrical characterization techniques for ultrathin FDSOI materials and devices

S Cristoloveanu, M Bawedin, I Ionica - Solid-State Electronics, 2016 - Elsevier
The characterization of nanosize SOI materials and devices is challenging because multiple
oxides, interfaces and channels coexist. Conventional measurement methods need to be …

Junctionless multiple-gate transistors for analog applications

RT Doria, MA Pavanello, RD Trevisoli… - … on Electron Devices, 2011 - ieeexplore.ieee.org
This paper presents the evaluation of the analog properties of nMOS junctionless (JL)
multigate transistors, comparing their performance with those exhibited by inversion-mode …

Influence of the dynamic access resistance in the g/sub m/and f/sub T/linearity of AlGaN/GaN HEMTs

T Palacios, S Rajan, A Chakraborty… - … on Electron Devices, 2005 - ieeexplore.ieee.org
The decrease of transconductance g/sub m/and current gain cutoff frequency f/sub T/at high
drain current levels in AlGaN/GaN high-electron mobility transistors (HEMTs) severely limits …

Mobility deception in nanoscale transistors: an untold contact story

JR Nasr, DS Schulman, A Sebastian… - Advanced …, 2019 - Wiley Online Library
Mobility is a critical parameter that is routinely used for benchmarking the performance of
field‐effect transistors (FETs) based on novel nanomaterials. In fact, mobility values are often …