Communication-free data allocation techniques for parallelizing compilers on multicomputers

TS Chen, JP Sheu - IEEE Transactions on Parallel and …, 1994 - ieeexplore.ieee.org
In distributed memory multicomputers, local memory accesses are much faster than those
involving interprocessor communication. For the sake of reducing or even eliminating the …

Effect-cause intra-cell diagnosis at transistor level

Z Sun, A Bosio, L Dilillo, P Girard… - … on Quality Electronic …, 2013 - ieeexplore.ieee.org
Logic diagnosis is the process of isolating possible sources of observed errors in a defective
circuit, so that physical failure analysis can be performed to determine the root cause of such …

A comprehensive framework for logic diagnosis of arbitrary defects

B Bosio, P Girard, S Pravossoudovitch… - IEEE Transactions on …, 2009 - ieeexplore.ieee.org
This paper presents a comprehensive framework for logic diagnosis consisting of two main
phases. In the first phase, a set of suspected faulty sites is obtained by applying an approach …

Diagnosis of multiple-voltage design with bridge defect

S Khursheed, BM Al-Hashimi… - IEEE transactions on …, 2009 - ieeexplore.ieee.org
Multiple voltage is an effective dynamic power reduction design technique commonly used
in low-power ICs. To the best of our knowledge, there is no reported work for diagnosing …

Fast bridging fault diagnosis using logic information

A Rousset, A Bosio, P Girard… - 16th Asian Test …, 2007 - ieeexplore.ieee.org
In this paper, we present a diagnosis methodology targeting the whole set of bridging faults
leading to either static or dynamic faulty behavior. The adopted diagnosis algorithm resorts …

Machine Learning Support for Logic Diagnosis and Defect Classification

HJ Wunderlich - Machine Learning Support for Fault Diagnosis of …, 2022 - Springer
Innovative manufacturing processes allow the integration of billions of transistors into a
single chip, and the implementation of extremely dense designs, but they also come with …

A comprehensive system-on-chip logic diagnosis

Y Benabboud, A Bosio, L Dilillo, P Girard… - 2010 19th IEEE …, 2010 - ieeexplore.ieee.org
This paper addresses the problem of logic diagnosis of System-on-Chip (SoC). We propose
a diagnosis approach based on a matching algorithm between a set of predicted failures …

A case study on logic diagnosis for System-on-Chip

Y Benabboud, A Bosio, P Girard… - … on Quality Electronic …, 2009 - ieeexplore.ieee.org
This paper presents an industrial case study on logic diagnosis targeting system-on-chip
(SoC). We first show the complexity and the issues related to the diagnosis of SoC. Then we …

Block-level fault model-free debug and diagnosis in digital systems

R Ubar, S Kostin, J Raik - 2009 12th Euromicro Conference on …, 2009 - ieeexplore.ieee.org
The concept of fault model free diagnosis is combined with cause-effect analysis in digital
systems represented as networks of functional blocks. We consider the diagnosis as a task …

A design-for-diagnosis technique for diagnosing both scan chain faults and combinational circuit faults

F Wang, Y Hu, H Li, X Li - 2008 Asia and South Pacific Design …, 2008 - ieeexplore.ieee.org
The amount of die area consumed by scan chains and scan control circuit can range from
15%~ 30%, and scan chain failures account for almost 50% of chip failures. As the …