Turnitin
降AI改写
早检测系统
早降重系统
Turnitin-UK版
万方检测-期刊版
维普编辑部版
Grammarly检测
Paperpass检测
checkpass检测
PaperYY检测
A new 13N-complexity memory built-in self-test algorithm to balance static random access memory static fault coverage and test time.
As memories dominate the system-on-chip (SoC), their quality significantly impacts the chip
manufacturing yield. There is a growing need to reduce the chip production time and cost …
manufacturing yield. There is a growing need to reduce the chip production time and cost …