Integrated circuit susceptibility to radiation-induced faults remains a major reliability concern.
The continuous downscaling of device feature size and the reduction in supply voltage in …

Soft errors in Integrated Circuits (ICs) have always been a major concern, particularly as
CMOS technology nodes continue to shrink, resulting in higher frequency, lower power, and …

Transient faults analysis is an important step in circuits designing flow. By a fast and
accurate scrutiny, it is possible to achieve a cost-effective and soft error tolerant system. In …

VLSI Integrated Circuits (ICs) constitute integral parts of modern systems. For this reason,
their reliability and performance have always been a matter of great concern and a …

In state-of-the-art technologies utilized to design Integrated Circuits (ICs), failures, called Soft
Errors caused by factors such as radiation or alpha particles, constitute a significant threat …