Discussion on electric power supply systems for all electric aircraft
The electric power supply system is one of the most important research areas within
sustainable and energy-efficient aviation for more-and especially all electric aircraft. This …
sustainable and energy-efficient aviation for more-and especially all electric aircraft. This …
Radiation-induced degradation of silicon carbide MOSFETs–A review
Abstract Silicon Carbide (SiC) Metal-Oxide-Semiconductor Field-Effect Transistors
(MOSFETs) have gained significant attention due to their ability to achieve lower on …
(MOSFETs) have gained significant attention due to their ability to achieve lower on …
Electrically active defects in SiC power MOSFETs
The performance and reliability of the state-of-the-art power 4H-SiC metal–oxide–
semiconductor field-effect transistors (MOSFETs) are affected by electrically active defects at …
semiconductor field-effect transistors (MOSFETs) are affected by electrically active defects at …
Review on the reliability mechanisms of SiC power MOSFETs: A comparison between planar-gate and trench-gate structures
J Wei, Z Wei, H Fu, J Cao, T Wu, J Sun… - … on Power Electronics, 2023 - ieeexplore.ieee.org
To clarify the current research situation and offer a better understanding of the reliability for
silicon carbide (SiC) power metal-oxide-semiconductor field-effect transistors (mosfet s), a …
silicon carbide (SiC) power metal-oxide-semiconductor field-effect transistors (mosfet s), a …
Impact of terrestrial neutrons on the reliability of SiC VD-MOSFET technologies
Accelerated terrestrial neutron irradiations were performed on different commercial SiC
power MOSFETs with planar, trench, and double-trench architectures. The results were used …
power MOSFETs with planar, trench, and double-trench architectures. The results were used …
Investigation and Failure Mode of Asymmetric and Double Trench SiC mosfets Under Avalanche Conditions
X Deng, H Zhu, X Li, X Tong, S Gao… - IEEE transactions on …, 2020 - ieeexplore.ieee.org
In this article, commercially 1200-V asymmetric and double trench silicon carbide (SiC)
metal-oxide-semiconductor-field-effect transistors (mosfets) from two manufacturers are …
metal-oxide-semiconductor-field-effect transistors (mosfets) from two manufacturers are …
Investigation of failure mechanisms of 1200 V rated trench SiC MOSFETs under repetitive avalanche stress
X Deng, W Huang, X Li, X Li, C Chen… - IEEE transactions on …, 2022 - ieeexplore.ieee.org
In this article, the repetitive avalanche ruggedness of silicon carbide metal–oxide–
semiconductor field-effect transistors (MOSFETs) with asymmetric trench (AT) and double …
semiconductor field-effect transistors (MOSFETs) with asymmetric trench (AT) and double …
Comparison of commercial planar and trench SiC MOSFETs by electrical characterization of performance-degrading near-interface traps
The suboptimal performance and low channel-carrier mobility of silicon carbide (SiC) power
MOSFETs are attributed to a high density of oxide traps near the 4H-SiC/SiO2 interface. In …
MOSFETs are attributed to a high density of oxide traps near the 4H-SiC/SiO2 interface. In …
Short-circuit capability prediction and failure mode of asymmetric and double trench SiC MOSFETs
X Deng, X Li, X Li, H Zhu, X Xu, Y Wen… - … on Power Electronics, 2020 - ieeexplore.ieee.org
In this article, short-circuit capability prediction and failure mode of 1200-V-class SiC
MOSFETs with a double and asymmetric trench structure are proposed under single-pulse …
MOSFETs with a double and asymmetric trench structure are proposed under single-pulse …
Short Circuit Capability and Short Circuit Induced Instability of a 1.2-kV SiC Power MOSFET
The withstand capability and threshold voltage (VTH) instability of 1.2-kV silicon carbide
(SiC) MOSFETs under repetitive short circuit (SC) tests are investigated. An SC test system …
(SiC) MOSFETs under repetitive short circuit (SC) tests are investigated. An SC test system …