Dynamic frequency and voltage scaling features have been introduced to manage ever-
growing heat and power consumption in modern processors. Design restrictions ensure …

The Rowhammer bug is a reliability issue in DRAM cells that can enable an unprivileged
adversary to flip the values of bits in neighboring rows on the memory module. Previous …

The Rowhammer bug allows unauthorized modification of bits in DRAM cells from
unprivileged software, enabling powerful privilege-escalation attacks. Sophisticated …

Due to aging, circuit reliability has become extraordinary challenging. Reliability-aware
circuit design flows do virtually not exist and even research is in its infancy. In this paper, we …

As technology scaling brings society closer to the vision of smart dust, system designers
must address the threat of physical attacks. To address the threat of physical access to …

Modern cryptography requires the ability to securely generate pseudorandom numbers.
However, despite decades of work on side-channel attacks, there is little discussion of their …

Detection of abnormal behaviors is essential in complex and/or strategic systems requiring a
high level of safety and security. Sensing environmental conditions to ensure that the device …

With the CMOS technology scaling, transistor aging has become one major issue affecting
circuit reliability and lifetime. There are two major classes of existing studies that model the …

The reliable operation of ICs is subject to physical effects like electromigration, thermal and
stress migration, negative bias temperature instability, hot-carrier injection, etc. While these …

With the modern semiconductor supply chain, the ownership of both intellectual property (IP)
and integrated circuit (IC) cannot be guaranteed. The IP piracy may take place at the …