[HTML][HTML] A review of semiconductor based ionising radiation sensors used in Harsh radiation environments and their applications
Simple Summary Ionising radiation affects electronic circuits as well as living beings and
has been a major concern for various critical applications such as healthcare, mining …
has been a major concern for various critical applications such as healthcare, mining …
Reliable on-chip systems in the nano-era: Lessons learnt and future trends
Reliability concerns due to technology scaling have been a major focus of researchers and
designers for several technology nodes. Therefore, many new techniques for enhancing and …
designers for several technology nodes. Therefore, many new techniques for enhancing and …
Physical attack protection techniques for IC chip level hardware security
Secure hardware systems are threatened by adversarial attempts on integrated circuit (IC)
chips in a practical utilization environment. This article provides overviews of physical …
chips in a practical utilization environment. This article provides overviews of physical …
A 286 F2/Cell Distributed Bulk-Current Sensor and Secure Flush Code Eraser Against Laser Fault Injection Attack on Cryptographic Processor
Laser fault injection (LFI) attack on cryptographic processors is a serious threat to
information security. This paper proposes a sense-and-react countermeasure against LFI. A …
information security. This paper proposes a sense-and-react countermeasure against LFI. A …
DELFINES: Detecting laser fault injection attacks via digital sensors
Laser Fault Injection Attacks (LFIA) are a major concern in physical security of electronic
circuits as they allow an attacker to inject a fault with a very high spatial accuracy. They are …
circuits as they allow an attacker to inject a fault with a very high spatial accuracy. They are …
Modeling and simulation of low power single event upset-resilient SRAM cell
N Pannu, NR Prakash - Analog Integrated Circuits and Signal Processing, 2025 - Springer
Radiation induced soft errors impact memory circuits and their response gets transposed or
disturbed which makes it crucial to protect the memory unit. Radiation-immune memory …
disturbed which makes it crucial to protect the memory unit. Radiation-immune memory …
Soft error detection and correction technique for radiation hardening based on C-element and BICS
Higher density of integration and lower power technologies are becoming more sensitive to
soft errors caused by radiations. Not only memories and latches are being affected but also …
soft errors caused by radiations. Not only memories and latches are being affected but also …
X-ray fault injection in non-volatile memories on power off devices
For several years, electronic components have taken an increasingly important place in our
societies. Their security has become an dominant matter as they can contain sensitive data …
societies. Their security has become an dominant matter as they can contain sensitive data …
An IC-level countermeasure against laser fault injection attack by information leakage sensing based on laser-induced opto-electric bulk current density
Laser fault injection (LFI) attacks on cryptographic processor ICs are a critical threat to
information systems. This paper proposes an IC-level integrated countermeasure employing …
information systems. This paper proposes an IC-level integrated countermeasure employing …
Improving the ability of Bulk Built-In Current Sensors to detect Single Event Effects by using triple-well CMOS
Abstract Bulk Built-In Current Sensors (bbics s) were introduced to detect the anomalous
transient currents induced in the bulk of integrated circuits when hit by ionizing particles. To …
transient currents induced in the bulk of integrated circuits when hit by ionizing particles. To …