Reliable on-chip systems in the nano-era: Lessons learnt and future trends

J Henkel, L Bauer, N Dutt, P Gupta, S Nassif… - Proceedings of the 50th …, 2013 - dl.acm.org
Reliability concerns due to technology scaling have been a major focus of researchers and
designers for several technology nodes. Therefore, many new techniques for enhancing and …

Physical attack protection techniques for IC chip level hardware security

M Nagata, T Miki, N Miura - IEEE transactions on very large …, 2021 - ieeexplore.ieee.org
Secure hardware systems are threatened by adversarial attempts on integrated circuit (IC)
chips in a practical utilization environment. This article provides overviews of physical …

A 286 F2/Cell Distributed Bulk-Current Sensor and Secure Flush Code Eraser Against Laser Fault Injection Attack on Cryptographic Processor

K Matsuda, T Fujii, N Shoji, T Sugawara… - IEEE Journal of Solid …, 2018 - ieeexplore.ieee.org
Laser fault injection (LFI) attack on cryptographic processors is a serious threat to
information security. This paper proposes a sense-and-react countermeasure against LFI. A …

DELFINES: Detecting laser fault injection attacks via digital sensors

M Ebrahimabadi, SS Mehjabin, R Viera… - … on Computer-Aided …, 2023 - ieeexplore.ieee.org
Laser Fault Injection Attacks (LFIA) are a major concern in physical security of electronic
circuits as they allow an attacker to inject a fault with a very high spatial accuracy. They are …

Modeling and simulation of low power single event upset-resilient SRAM cell

N Pannu, NR Prakash - Analog Integrated Circuits and Signal Processing, 2025 - Springer
Radiation induced soft errors impact memory circuits and their response gets transposed or
disturbed which makes it crucial to protect the memory unit. Radiation-immune memory …

Soft error detection and correction technique for radiation hardening based on C-element and BICS

DG Toro, M Arzel, F Seguin… - IEEE transactions on …, 2014 - ieeexplore.ieee.org
Higher density of integration and lower power technologies are becoming more sensitive to
soft errors caused by radiations. Not only memories and latches are being affected but also …

X-ray fault injection in non-volatile memories on power off devices

P Grandamme, L Bossuet… - 2023 IEEE Physical …, 2023 - ieeexplore.ieee.org
For several years, electronic components have taken an increasingly important place in our
societies. Their security has become an dominant matter as they can contain sensitive data …

An IC-level countermeasure against laser fault injection attack by information leakage sensing based on laser-induced opto-electric bulk current density

K Matsuda, S Tada, M Nagata, Y Komano… - Japanese Journal of …, 2020 - iopscience.iop.org
Laser fault injection (LFI) attacks on cryptographic processor ICs are a critical threat to
information systems. This paper proposes an IC-level integrated countermeasure employing …

Improving the ability of Bulk Built-In Current Sensors to detect Single Event Effects by using triple-well CMOS

JM Dutertre, RP Bastos, O Potin, ML Flottes… - Microelectronics …, 2014 - Elsevier
Abstract Bulk Built-In Current Sensors (bbics s) were introduced to detect the anomalous
transient currents induced in the bulk of integrated circuits when hit by ionizing particles. To …