High‐speed and low‐energy nitride memristors

BJ Choi, AC Torrezan, JP Strachan… - Advanced Functional …, 2016‏ - Wiley Online Library
High‐performance memristors based on AlN films have been demonstrated, which exhibit
ultrafast ON/OFF switching times (≈ 85 ps for microdevices with waveguide) and relatively …

Electrical Performance and Scalability of Pt Dispersed SiO2 Nanometallic Resistance Switch

BJ Choi, AC Torrezan, KJ Norris, F Miao… - Nano …, 2013‏ - ACS Publications
Highly reproducible bipolar resistance switching was recently demonstrated in a composite
material of Pt nanoparticles dispersed in silicon dioxide. Here, we examine the electrical …

High on–off ratio improvement of ZnO-based forming-free memristor by surface hydrogen annealing

Y Sun, X Yan, X Zheng, Y Liu, Y Zhao… - … applied materials & …, 2015‏ - ACS Publications
In this work, a high-performance, forming-free memristor based on Au/ZnO nanorods/AZO
(Al-doped ZnO conductive glass) sandwich structure has been developed by rapid hydrogen …

Resistive switching characteristics of Si3N4-based resistive-switching random-access memory cell with tunnel barrier for high density integration and low-power …

S Kim, S Jung, MH Kim, S Cho, BG Park - Applied Physics Letters, 2015‏ - pubs.aip.org
In this letter, a bipolar resistive-switching random-access memory (RRAM) in Ni/Si 3 N 4/SiO
2/p+-Si structure and its fabrication process are demonstrated. The proposed device with …

a-SiNx:H-based ultra-low power resistive random access memory with tunable Si dangling bond conduction paths

X Jiang, Z Ma, J Xu, K Chen, L Xu, W Li, X Huang… - Scientific Reports, 2015‏ - nature.com
The realization of ultra-low power Si-based resistive switching memory technology will be a
milestone in the development of next generation non-volatile memory. Here we show that a …

Stable bipolar resistive switching characteristics and resistive switching mechanisms observed in aluminum nitride-based ReRAM devices

HD Kim, HM An, EB Lee, TG Kim - IEEE transactions on …, 2011‏ - ieeexplore.ieee.org
The authors report upon the ultrafast bipolar switching characteristics observed in aluminum
nitride (AlN)-based resistive random access memory devices ReRAMs. The set and reset …

Migration of interfacial oxygen ions modulated resistive switching in oxide-based memory devices

C Chen, S Gao, F Zeng, GS Tang, SZ Li… - Journal of Applied …, 2013‏ - pubs.aip.org
Oxides-based resistive switching memory induced by oxygen ions migration is attractive for
future nonvolatile memories. Numerous works had focused their attentions on the …

Memory Properties of SiOx- and SiNx-Based Memristors

VA Gritsenko, AA Gismatulin, OM Orlov - Nanobiotechnology Reports, 2021‏ - Springer
Silicon oxide and silicon nitride are the two key dielectrics used in modern silicon devices.
The memory properties of SiO x-and SiN x-based memristors obtained by plasma-enhanced …

Transparent resistive switching memory using ITO/AlN/ITO capacitors

HD Kim, HM An, Y Seo, TG Kim - IEEE Electron Device Letters, 2011‏ - ieeexplore.ieee.org
This letter covers the fabrication of a transparent resistive random access memory (T-
ReRAM) device using ITO/AlN/ITO capacitors and its observed resistive switching …

Beyond the highs and lows: A perspective on the future of dielectrics research for nanoelectronic devices

M Jenkins, DZ Austin, JF Conley, J Fan… - ECS Journal of Solid …, 2019‏ - iopscience.iop.org
High-dielectric constant (high-k) gate oxides and low-dielectric constant (low-k) interlayer
dielectrics (ILD) have dominated the nanoelectronic materials research scene over the past …