Machine Learning for industrial applications: A comprehensive literature review
Abstract Machine Learning (ML) is a branch of artificial intelligence that studies algorithms
able to learn autonomously, directly from the input data. Over the last decade, ML …
able to learn autonomously, directly from the input data. Over the last decade, ML …
Toward intelligent industrial informatics: A review of current developments and future directions of artificial intelligence in industrial applications
Research, the universal pursuit of new knowledge, is embarking on a fresh journey into
artificial intelligence (AI). ature reports that AI arose nine places to the fourth-most popular …
artificial intelligence (AI). ature reports that AI arose nine places to the fourth-most popular …
[HTML][HTML] Degradation curves integration in physics-based models: Towards the predictive maintenance of industrial robots
P Aivaliotis, Z Arkouli, K Georgoulias… - Robotics and computer …, 2021 - Elsevier
Predictive maintenance has been proposed to maximize the overall plant availability of
modern manufacturing systems. To this end, research has been conducted mainly on data …
modern manufacturing systems. To this end, research has been conducted mainly on data …
Business analytics in Industry 4.0: A systematic review
Abstract Recently, the term “Industry 4.0” has emerged to characterize several Information
Technology and Communication (ICT) adoptions in production processes (eg, Internet‐of …
Technology and Communication (ICT) adoptions in production processes (eg, Internet‐of …
Decision-based virtual metrology for advanced process control to empower smart production and an empirical study for semiconductor manufacturing
Virtual metrology (VM) has been employed to improve the performance of advanced process
control for semiconductor manufacturing. A number of VM models have been proposed to …
control for semiconductor manufacturing. A number of VM models have been proposed to …
Virtual metrology in semiconductor manufacturing: Current status and future prospects
Abstract Advanced Process Control (APC) has become an increasingly pressing issue for
the semiconductor industry, particularly in the new era of sub-5nm process technology. To …
the semiconductor industry, particularly in the new era of sub-5nm process technology. To …
A deep learning model for identification of defect patterns in semiconductor wafer map
Y Yuan-Fu - 2019 30th Annual SEMI Advanced Semiconductor …, 2019 - ieeexplore.ieee.org
The semiconductors are used as various precision components in many electronic products.
Each layer must be inspected of defect after drawing and baking the mask pattern in wafer …
Each layer must be inspected of defect after drawing and baking the mask pattern in wafer …
DeepVM: A Deep Learning-based approach with automatic feature extraction for 2D input data Virtual Metrology
Abstract Industry 4.0 encapsulates methods, technologies, and procedures that transform
data into informed decisions and added value in an industrial context. In this regard …
data into informed decisions and added value in an industrial context. In this regard …
[HTML][HTML] Machine learning for semiconductors
DY Liu, LM Xu, XM Lin, X Wei, WJ Yu, Y Wang, ZM Wei - Chip, 2022 - Elsevier
Thanks to the increasingly high standard of electronics, the semiconductor material science
and semiconductor manufacturing have been booming in the last few decades, with massive …
and semiconductor manufacturing have been booming in the last few decades, with massive …
Soft metrology based on machine learning: a review
Soft metrology has been defined as a set of measurement techniques and models that allow
the objective quantification of properties usually determined by human perception such as …
the objective quantification of properties usually determined by human perception such as …