Recent trend of FinFET devices and its challenges: A review

RS Pal, S Sharma, S Dasgupta - 2017 Conference on …, 2017 - ieeexplore.ieee.org
Recent technological demand of FinFETs have been explored and reviewed in this work.
The downscaling of the conventional MOSFET urge to the researchers to innovate new …

Enhanced Electrostatic Integrity of Short-Channel Junctionless Transistor With High- Spacers

S Gundapaneni, S Ganguly… - IEEE Electron Device …, 2011 - ieeexplore.ieee.org
We propose the use of a high-κ spacer to improve the electrostatic integrity and, thereby, the
scalability of silicon junctionless transistors (JLTs) for the first time. Using extensive …

A 10 nm FinFET 128 Mb SRAM with assist adjustment system for power, performance, and area optimization

T Song, W Rim, S Park, Y Kim, G Yang… - IEEE Journal of Solid …, 2016 - ieeexplore.ieee.org
Two 128 Mb 6T SRAM test chips are implemented in a 10 nm FinFET technology. A 0.040
6T SRAM bitcell is designed for high density (HD), and 0.049 for high performance (HP). The …

Halo-doped hetero dielectric nanowire mosfet scaled to the sub-10 nm node

PK Kumar, B Balaji, KS Rao - Transactions on Electrical and Electronic …, 2023 - Springer
This paper aims to propose a halo-doped hetero dielectric nanowire MOSFET with underlap-
extension and spacer, scaling to the sub-10 nm regime. We demonstrate that halo do** at …

Insights into the design and optimization of tunnel-FET devices and circuits

A Pal, AB Sachid, H Gossner… - IEEE Transactions on …, 2011 - ieeexplore.ieee.org
Improving the on-current has been the focus of enhancing the performance of tunnel field-
effect transistors (TFETs). In this paper, we show that the increase in I_ON is not sufficient to …

Optimizing u-shape FinFETs for sub-5nm technology: performance analysis and device-to-circuit evaluation in digital and analog/radio frequency applications

KV Ramakrishna, S Valasa, S Bhukya… - ECS Journal of Solid …, 2023 - iopscience.iop.org
FinFET is considered as the potential contender in the era of Multigate FETs. This
manuscript for the first time presents the structural variations for Junctionless FinFET devices …

Spacer design guidelines for nanowire FETs from gate-induced drain leakage perspective

S Sahay, MJ Kumar - IEEE Transactions on Electron Devices, 2017 - ieeexplore.ieee.org
In this paper, we study for the first time the impact of the design of gate sidewall spacer on
the gate-induced drain leakage (GIDL) of: 1) the conventional nanowire (NW) FETs and 2) …

FinFET With High- Spacers for Improved Drive Current

AB Sachid, MC Chen, C Hu - IEEE electron device letters, 2016 - ieeexplore.ieee.org
We demonstrate p-channel gate-source/drain underlapped silicon FinFET with HfO 2 high-
spacer and compare it with its counterpart having SiO 2 low-spacer. The HfO 2 spacer …

Dual- Spacer Device Architecture for the Improvement of Performance of Silicon n-Channel Tunnel FETs

HG Virani, RBR Adari… - IEEE transactions on …, 2010 - ieeexplore.ieee.org
A dual-k spacer concept is proposed and evaluated in underlap and nonunderlap n-channel
silicon tunnel field-effect transistors (FETs) for the first time using extensive device …

Performance analysis of sub 10 nm regime source halo symmetric and asymmetric nanowire MOSFET with underlap engineering

PK Kumar, B Balaji, KS Rao - Silicon, 2022 - Springer
In this paper, we are proposing a gate oxide stack source halo symmetric and asymmetric
underlap extension nanowire MOSFET with HfO2 spacer at 10 nm regime. The increased …