New insights into single event transient propagation in chains of inverters—Evidence for propagation-induced pulse broadening
V Ferlet-Cavrois, P Paillet, D McMorrow… - … on Nuclear Science, 2007 - ieeexplore.ieee.org
The generation and propagation of single event transients (SET) is measured and modeled
in SOI inverter chains with different designs. SET propagation in inverter chains induces …
in SOI inverter chains with different designs. SET propagation in inverter chains induces …
Modeling single event transients in advanced devices and ICs
The ability for Single Event Transients (SETs) to induce soft errors in Integrated Circuits (ICs)
was predicted for the first time by Wallmark and Marcus in the early 60's and was confirmed …
was predicted for the first time by Wallmark and Marcus in the early 60's and was confirmed …
Investigation of the propagation induced pulse broadening (PIPB) effect on single event transients in SOI and bulk inverter chains
V Ferlet-Cavrois, V Pouget, D McMorrow… - … on Nuclear Science, 2008 - ieeexplore.ieee.org
The propagation of single event transients (SET) is measured and modeled in SOI and bulk
inverter chains. The propagation-induced pulse broadening (PIPB) effect is shown to …
inverter chains. The propagation-induced pulse broadening (PIPB) effect is shown to …
Study of SEU sensitivity of SRAM-based radiation monitors in 65-nm CMOS
This article presents a static random access memory (SRAM)-based flexible radiation
monitor. The monitor was fabricated in a 65-nm CMOS technology and it is designed as an …
monitor. The monitor was fabricated in a 65-nm CMOS technology and it is designed as an …
Temperature dependence of digital SET pulse width in bulk and SOI technologies
C Shuming, L Bin, L Biwei… - IEEE Transactions on …, 2008 - ieeexplore.ieee.org
Using three-dimensional mixed-mode simulation, temperature dependence of digital SET
pulse width in bulk and PD SOI inverter chains has been studied. It was found that …
pulse width in bulk and PD SOI inverter chains has been studied. It was found that …
Physically based predictive model for single event transients in CMOS gates
M Saremi, A Privat, HJ Barnaby… - IEEE Transactions on …, 2016 - ieeexplore.ieee.org
An analytical model is presented to understand the time response of an inverter to ionizing
particles based on physical equations. The model divides the output voltage transient …
particles based on physical equations. The model divides the output voltage transient …
Modeling and simulation of the programmable metallization cells (PMCs) and diamond-based power devices
M Saremi - 2017 - search.proquest.com
This PhD thesis consists of three main themes. The first part focusses on modeling of Silver
(Ag)-Chalcogenide glass based resistive memory devices known as the Programmable …
(Ag)-Chalcogenide glass based resistive memory devices known as the Programmable …
Analytical modeling of single event transients propagation in combinational logic gates
X Gili, S Barcelo, J Segura - IEEE Transactions on Nuclear …, 2012 - ieeexplore.ieee.org
We present a single event transient (SET) propagation model that can be used to quantify
the propagation likelihood of a given noise waveform trough CMOS logic gates. This …
the propagation likelihood of a given noise waveform trough CMOS logic gates. This …
Device-physics-based analytical model for single-event transients in SOI CMOS logic
D Kobayashi, K Hirose, V Ferlet-Cavrois… - … on Nuclear Science, 2009 - ieeexplore.ieee.org
An analytical model is developed to calculate the single-event transient (SET) pulse widths
in advanced silicon-on-insulator (SOI) CMOS logic. Waveform analysis reveals that the width …
in advanced silicon-on-insulator (SOI) CMOS logic. Waveform analysis reveals that the width …
Impact of single-event transient duration and electrical delay at reduced supply voltages on set mitigation techniques
Single-event transients (SETs) in 16-/14-nm bulk fin field effect transistor (finFET) logic
chains have been measured using a custom-designed test IC. A variety of logic gate chains …
chains have been measured using a custom-designed test IC. A variety of logic gate chains …