Next generation intra-vehicle backbone network architectures

O Alparslan, S Arakawa… - 2021 IEEE 22nd …, 2021 - ieeexplore.ieee.org
Increasing bandwidth requirements in vehicles are pushing the backbone architectures to
use faster switching technologies like Ethernet. However, the traditional Ethernet cannot …

Useful lifetime analysis for high-power white LEDs

FK Wang, YC Lu - Microelectronics Reliability, 2014 - Elsevier
An accelerated degradation test is used to analyze the useful lifetime of high-power white
light-emitting diodes (HPWLEDs) as the point at which the light output declines to 70% of the …

[BUCH][B] Reliability Investigation of LED Devices for Public Light Applications

R Baillot, Y Deshayes - 2017 - books.google.com
Reliability Investigation of LED Devices for Public Light Applications focuses on state-of-the-
art GaN-based LED technology through the study of typical failure mechanisms in public …

Edge viewing photodetectors for strictly in-plane lightwave circuit integration and flexible optical interconnects

D Guidotti, J Yu, M Blaser… - 56th Electronic …, 2006 - ieeexplore.ieee.org
We have developed a parallel process for the cost effective fabrication of active lightwave
circuits and optical transceivers. In this novel process no out-of-plane beam turning …

A unified multiple stress reliability model for microelectronic devices—Application to 1.55 μm DFB laser diode module for space validation

A Bensoussan, E Suhir, P Henderson, M Zahir - Microelectronics Reliability, 2015 - Elsevier
The establishment of European suppliers for DFB Laser Modules at 1.55 μm is considered to
be essential in the context of future European space programs, where availability, cost and …

Monte-carlo computations for predicted degradation of photonic devices in space environment

L Bechou, Y Deshayes, Y Ousten… - 2015 IEEE …, 2015 - ieeexplore.ieee.org
Photonic systems are more and more used for aerospace applications and most of these
systems require reliable optoelectronic emitters or photodetectors such as Laser diodes or …

Applying grey model to predict the useful lifetime for high-power white LEDs

FK Wang, YC Lu, TP Chu - Optical and Quantum Electronics, 2016 - Springer
An accelerated degradation test has been widely used to analyze the useful lifetime of high-
power white light-emitting diodes (HPWLEDs). A two-stage method is proposed to predict …

Reliability investigation and failure analysis of 25Gb/s 850 nm oxide-confined VCSELs

Y Zhang, J Zhao - … on Information Optics and Photonics (CIOP …, 2023 - spiedigitallibrary.org
High-speed (25 Gb/s) oxide-confined VCSELs operating at 850 nm have gained widespread
use in data communications. However, ensuring their reliability remains a significant …

Challenges and potential of new approaches for reliability assessment of nanotechnologies

L Béchou, Y Danto, JY Deletage… - Comptes …, 2008 - comptes-rendus.academie-sciences …
Reliability assessment of components, integrated circuits or micro-assemblied devices, is
undoubtedly identified as one of the major factors conditioning the on-going development of …

25 Gb/s 粗波分复用分布式反馈激光器的可靠性研究

张玉岐, 刘万居, 赵佳 - Optical Communication Technology, 2022 - opticsjournal.net
摘要高速波分复用分布式反馈(DFB) 激光器是数据通信的核心器件, 其可靠性影响了整个通信
系统的可靠性. 对自主研发的25 Gb/s 4 波长粗波分复用(CWDM4) DFB 激光器进行了2 …