Next generation intra-vehicle backbone network architectures
O Alparslan, S Arakawa… - 2021 IEEE 22nd …, 2021 - ieeexplore.ieee.org
Increasing bandwidth requirements in vehicles are pushing the backbone architectures to
use faster switching technologies like Ethernet. However, the traditional Ethernet cannot …
use faster switching technologies like Ethernet. However, the traditional Ethernet cannot …
Useful lifetime analysis for high-power white LEDs
FK Wang, YC Lu - Microelectronics Reliability, 2014 - Elsevier
An accelerated degradation test is used to analyze the useful lifetime of high-power white
light-emitting diodes (HPWLEDs) as the point at which the light output declines to 70% of the …
light-emitting diodes (HPWLEDs) as the point at which the light output declines to 70% of the …
[BUCH][B] Reliability Investigation of LED Devices for Public Light Applications
R Baillot, Y Deshayes - 2017 - books.google.com
Reliability Investigation of LED Devices for Public Light Applications focuses on state-of-the-
art GaN-based LED technology through the study of typical failure mechanisms in public …
art GaN-based LED technology through the study of typical failure mechanisms in public …
Edge viewing photodetectors for strictly in-plane lightwave circuit integration and flexible optical interconnects
D Guidotti, J Yu, M Blaser… - 56th Electronic …, 2006 - ieeexplore.ieee.org
We have developed a parallel process for the cost effective fabrication of active lightwave
circuits and optical transceivers. In this novel process no out-of-plane beam turning …
circuits and optical transceivers. In this novel process no out-of-plane beam turning …
A unified multiple stress reliability model for microelectronic devices—Application to 1.55 μm DFB laser diode module for space validation
A Bensoussan, E Suhir, P Henderson, M Zahir - Microelectronics Reliability, 2015 - Elsevier
The establishment of European suppliers for DFB Laser Modules at 1.55 μm is considered to
be essential in the context of future European space programs, where availability, cost and …
be essential in the context of future European space programs, where availability, cost and …
Monte-carlo computations for predicted degradation of photonic devices in space environment
Photonic systems are more and more used for aerospace applications and most of these
systems require reliable optoelectronic emitters or photodetectors such as Laser diodes or …
systems require reliable optoelectronic emitters or photodetectors such as Laser diodes or …
Applying grey model to predict the useful lifetime for high-power white LEDs
An accelerated degradation test has been widely used to analyze the useful lifetime of high-
power white light-emitting diodes (HPWLEDs). A two-stage method is proposed to predict …
power white light-emitting diodes (HPWLEDs). A two-stage method is proposed to predict …
Reliability investigation and failure analysis of 25Gb/s 850 nm oxide-confined VCSELs
Y Zhang, J Zhao - … on Information Optics and Photonics (CIOP …, 2023 - spiedigitallibrary.org
High-speed (25 Gb/s) oxide-confined VCSELs operating at 850 nm have gained widespread
use in data communications. However, ensuring their reliability remains a significant …
use in data communications. However, ensuring their reliability remains a significant …
Challenges and potential of new approaches for reliability assessment of nanotechnologies
L Béchou, Y Danto, JY Deletage… - Comptes …, 2008 - comptes-rendus.academie-sciences …
Reliability assessment of components, integrated circuits or micro-assemblied devices, is
undoubtedly identified as one of the major factors conditioning the on-going development of …
undoubtedly identified as one of the major factors conditioning the on-going development of …
25 Gb/s 粗波分复用分布式反馈激光器的可靠性研究
张玉岐, 刘万居, 赵佳 - Optical Communication Technology, 2022 - opticsjournal.net
摘要高速波分复用分布式反馈(DFB) 激光器是数据通信的核心器件, 其可靠性影响了整个通信
系统的可靠性. 对自主研发的25 Gb/s 4 波长粗波分复用(CWDM4) DFB 激光器进行了2 …
系统的可靠性. 对自主研发的25 Gb/s 4 波长粗波分复用(CWDM4) DFB 激光器进行了2 …