Because of the isolation of transistors, fully depleted silicon-on-insulator (FDSOI) technology
nodes have shown better single-event upset (SEU) resilience compared with bulk …

Featured Application The DICE flip-flops presented in this work show strong resistance to
single event upsets making them attractive for use in space or in environments where high …

In this work, single-event upset (SEU) and single-event transient (SET) responses of digital
logic in a planar 22 nm conventional-well fully depleted silicon-on-insulator (FD-SOI) …

Fault tolerance is crucial for mission-critical FPGA-based systems in radiation environments.
Soft-core processors in these systems, performing both control and computational tasks …

Three layout-hardened Dual Interlocked Storage Cell (DICE) D Flip-Flops (DFFs) were
designed and manufactured based on an advanced 28 nm planar technology. The …

The advanced FDSOI technology has improved performance and inherent SEU resistance
of integrated circuits, which is beneficial to the space applications. This paper provides the …

The radiation sensitivity of the Static Random-Access Memory (SRAM) device depends on
the basic memory cell and peripheral circuits, and the influence of peripheral circuits is …

D flip-flop (DFF) is the basic unit of sequential logic in digital circuits. However, because of
an internal cross-coupled inverter pair, it can easily appear as a single event upset (SEU) …

Designing a radiation-tolerant SRAM-based system poses a significant challenge for space
facilities operating in radiation environments. Accurate evaluation of SEE sensitivity, along …

This paper addresses the issue of soft error mitigation for Static Random-Access Memory
(SRAM)-based Field Programmable Gate Arrays (FPGAs) system in radiation environment to …