Artificial intelligence applications in supply chain management

M Pournader, H Ghaderi, A Hassanzadegan… - International Journal of …, 2021 - Elsevier
This paper presents a systematic review of studies related to artificial intelligence (AI)
applications in supply chain management (SCM). Our systematic search of the related …

Multivariate statistical process control charts: an overview

S Bersimis, S Psarakis… - Quality and Reliability …, 2007 - Wiley Online Library
In this paper we discuss the basic procedures for the implementation of multivariate
statistical process control via control charting. Furthermore, we review multivariate …

A review of machine learning kernel methods in statistical process monitoring

A Apsemidis, S Psarakis, JM Moguerza - Computers & Industrial …, 2020 - Elsevier
The complexity of modern problems turns increasingly larger in industrial environments, so
the classical process monitoring techniques have to adapt to deal with those problems. This …

A multivariate sign EWMA control chart

C Zou, F Tsung - Technometrics, 2011 - Taylor & Francis
Nonparametric control charts are useful in statistical process control (SPC) when there is a
lack of or limited knowledge about the underlying process distribution, especially when the …

Application of machine learning in statistical process control charts: A survey and perspective

PH Tran, A Ahmadi Nadi, TH Nguyen, KD Tran… - Control charts and …, 2022 - Springer
Over the past decades, control charts, one of the essential tools in Statistical Process Control
(SPC), have been widely implemented in manufacturing industries as an effective approach …

Recent developments of control charts, identification of big data sources and future trends of current research

RG Aykroyd, V Leiva, F Ruggeri - Technological Forecasting and Social …, 2019 - Elsevier
Control charts are one of the principal tools to monitor dynamic processes with the aim of
rapid identification of changes in the behaviour of these processes. Such changes are …

Statistical learning methods applied to process monitoring: An overview and perspective

M Weese, W Martinez, FM Megahed… - Journal of Quality …, 2016 - Taylor & Francis
The increasing availability of high-volume, high-velocity data sets, often containing variables
of different data types, brings an increasing need for monitoring tools that are designed to …

Adaptive Mahalanobis Distance and -Nearest Neighbor Rule for Fault Detection in Semiconductor Manufacturing

G Verdier, A Ferreira - IEEE Transactions on Semiconductor …, 2010 - ieeexplore.ieee.org
In recent years, fault detection has become a crucial issue in semiconductor manufacturing.
Indeed, it is necessary to constantly improve equipment productivity. Rapid detection of …

A weighted support vector machine method for control chart pattern recognition

P Xanthopoulos, T Razzaghi - Computers & Industrial Engineering, 2014 - Elsevier
Manual inspection and evaluation of quality control data is a tedious task that requires the
undistracted attention of specialized personnel. On the other hand, automated monitoring of …

One-class classification-based control charts for multivariate process monitoring

T Sukchotrat, SB Kim, F Tsung - IIE transactions, 2009 - Taylor & Francis
One-class classification problems have attracted a great deal of attention from various
disciplines. In the present study, attempts are made to extend the scope of application of the …