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Recent advances of artificial intelligence in manufacturing industrial sectors: A review
The recent advances in artificial intelligence have already begun to penetrate our daily lives.
Even though the development is still in its infancy, it has been shown that it can outperform …
Even though the development is still in its infancy, it has been shown that it can outperform …
Advances in machine learning and deep learning applications towards wafer map defect recognition and classification: a review
With the high demand and sub-nanometer design for integrated circuits, surface defect
complexity and frequency for semiconductor wafers have increased; subsequently …
complexity and frequency for semiconductor wafers have increased; subsequently …
Deep learning based attack detection for cyber-physical system cybersecurity: A survey
With the booming of cyber attacks and cyber criminals against cyber-physical systems
(CPSs), detecting these attacks remains challenging. It might be the worst of times, but it …
(CPSs), detecting these attacks remains challenging. It might be the worst of times, but it …
Machine vision intelligence for product defect inspection based on deep learning and Hough transform
Abstract Machine vision based product inspection methods have been widely investigated to
improve product quality and reduce labour costs. Recent advancement in deep learning …
improve product quality and reduce labour costs. Recent advancement in deep learning …
A review and analysis of automatic optical inspection and quality monitoring methods in electronics industry
Electronics industry is one of the fastest evolving, innovative, and most competitive
industries. In order to meet the high consumption demands on electronics components …
industries. In order to meet the high consumption demands on electronics components …
An unknown wafer surface defect detection approach based on Incremental Learning for reliability analysis
Wafer maps include information about multiple defect patterns on the wafer surface.
Intelligent categorization of the defective wafer is essential for investigating the underlying …
Intelligent categorization of the defective wafer is essential for investigating the underlying …
A systematic review of deep learning for silicon wafer defect recognition
Advancements in technology have made deep learning a hot research area, and we see its
applications in various fields. Its widespread use in silicon wafer defect recognition is …
applications in various fields. Its widespread use in silicon wafer defect recognition is …
WaferSegClassNet-A light-weight network for classification and segmentation of semiconductor wafer defects
As the integration density and design intricacy of semiconductor wafers increase, the
magnitude and complexity of defects in them are also on the rise. Since the manual …
magnitude and complexity of defects in them are also on the rise. Since the manual …
Artificial intelligence applications for MEMS-based sensors and manufacturing process optimization
Micro-electromechanical systems (MEMS) technology-based sensors have found diverse
fields of application due to the advancement in semiconductor manufacturing technology …
fields of application due to the advancement in semiconductor manufacturing technology …
FaultFace: Deep convolutional generative adversarial network (DCGAN) based ball-bearing failure detection method
Failure detection is employed in the industry to improve system performance and reduce
costs due to unexpected malfunction events. So, a good dataset of the system is desirable …
costs due to unexpected malfunction events. So, a good dataset of the system is desirable …