Low frequency impedance measurement using sine-fitting

PM Ramos, MF Da Silva, AC Serra - Measurement, 2004 - Elsevier
This paper describes an impedance measurement technique based on the use of a
personal computer, two digitizing channels and the application of four-parameter sine-fitting …

Combined spectral and histogram analysis for fast ADC testing

AC Serra, MF da Silva, PM Ramos… - IEEE Transactions …, 2005 - ieeexplore.ieee.org
The integral nonlinearity (INL) of analog-to-digital converters (ADCs) can be described by a
behavioral error model expressed as one-dimensional image in the code domain. This …

A survey on nonlinear analog-to-digital converters

M Santos, N Horta, J Guilherme - Integration, 2014 - Elsevier
This paper presents a survey on Nonlinear Analog-to-Digital converters (ADC). This class of
converters is extremely relevant in applications where there is a need for non-uniform …

Exploiting pipeline ADC properties for a reduced-code linearity test technique

A Laraba, HG Stratigopoulos, S Mir… - IEEE Transactions on …, 2015 - ieeexplore.ieee.org
Testing the static performances of high-resolution analog-to-digital converters (ADCs)
consumes long test times that are disproportionately high with respect to the test time …

Test time reduction of successive approximation register A/D converter by selective code measurement

S Goyal, A Chatterjee, M Atia, H Iglehart… - … Conference on Test …, 2005 - ieeexplore.ieee.org
This paper proposes a novel methodology for reducing the static linearity test time of SAR
A/D converters. Due to the low data conversion rate and high resolution, the test time …

Uncertainty of ADC random noise estimates obtained with the IEEE 1057 standard test

FAC Alegria, AM da Cruz Serra - IEEE transactions on …, 2005 - ieeexplore.ieee.org
In this paper, the uncertainty of the estimated standard deviation of the random noise
present in analog-to-digital converters (ADCs), using the test suggested in the IEEE 1057-94 …

Code-density test of analog-to-digital converters using single low-linearity stimulus signal

L **, D Chen, RL Geiger - IEEE Transactions on …, 2009 - ieeexplore.ieee.org
High-precision analog-to-digital converter (ADC) testing is a challenging problem because
of its stringent requirement on a test signal's linearity. This paper introduces a method that …

Error in the estimation of transition voltages with the standard histogram test of ADCs

FC Alegria, AC Serra - Measurement, 2004 - Elsevier
In this paper we address the use of overdrive in the standard histogram test of analog to
digital converters. The error in the estimation of the transition voltages due to the presence of …

INL systematic reduced-test technique for Pipeline ADCs

E Peralías, A Ginés, A Rueda - 2014 19th IEEE European Test …, 2014 - ieeexplore.ieee.org
This paper presents a procedure to implement a high efficient test of the Integral Non-
linearity (INL) of Pipeline ADCs using an extremely reduced set of test input amplitude levels …

Linearity testing of A/D converters using selective code measurement

S Goyal, A Chatterjee - Journal of Electronic Testing, 2008 - Springer
Measurement of integral non-linearity (INL) and differential non-linearity (DNL) of an A/D
converter using the histogram method incurs large test time. This test time can be a …