Nanoscale Electron Transfer Variations at Electrocatalyst–Electrolyte Interfaces Resolved by in Situ Conductive Atomic Force Microscopy

M Munz, J Poon, W Frandsen… - Journal of the …, 2023‏ - ACS Publications
Rational innovation of electrocatalysts requires detailed knowledge of spatial property
variations across the solid–electrolyte interface. We introduce correlative atomic force …

Metallic Twin Grain Boundaries Embedded in MoSe2 Monolayers Grown by Molecular Beam Epitaxy

Y Ma, S Kolekar, H Coy Diaz, J Aprojanz, I Miccoli… - ACS …, 2017‏ - ACS Publications
Twin grain boundaries in MoSe2 are metallic and undergo a metal to insulator Peierls
transition at low temperature. Growth of MoSe2 by molecular beam epitaxy results in the …

Probing defect dynamics in monolayer MoS2 via noise nanospectroscopy

SH Song, MK Joo, M Neumann, H Kim… - Nature communications, 2017‏ - nature.com
Monolayer molybdenum disulfide (MoS2) has received intense interest as a strong
candidate for next-generation electronics. However, the observed electrical properties of …

Conductive atomic force microscope study of bipolar and threshold resistive switching in 2D hexagonal boron nitride films

A Ranjan, N Raghavan, SJ O'shea, S Mei, M Bosman… - Scientific reports, 2018‏ - nature.com
This study investigates the resistive switching characteristics and underlying mechanism in
2D layered hexagonal boron nitride (h-BN) dielectric films using conductive atomic force …

Dielectric breakdown in chemical vapor deposited hexagonal boron nitride

L Jiang, Y Shi, F Hui, K Tang, Q Wu, C Pan… - … Applied Materials & …, 2017‏ - ACS Publications
Insulating films are essential in multiple electronic devices because they can provide
essential functionalities, such as capacitance effects and electrical fields. Two-dimensional …

[HTML][HTML] Memristor compact model with oxygen vacancy concentrations as state variables

A Zeumault, S Alam, M Omar Faruk… - Journal of Applied Physics, 2022‏ - pubs.aip.org
We present a unique compact model for oxide memristors based upon the concentration of
oxygen vacancies as state variables. In this model, the increase (decrease) in oxygen …

Understanding the Resistive Switching Phenomena of Stacked Al/Al2O3/Al Thin Films from the Dynamics of Conductive Filaments

J Molina-Reyes, L Hernandez-Martinez - Complexity, 2017‏ - Wiley Online Library
We present the resistive switching characteristics of Metal‐Insulator‐Metal (MIM) devices
based on amorphous Al2O3 which is deposited by Atomic Layer Deposition (ALD). A …

Random telegraph noise in 2D hexagonal boron nitride dielectric films

A Ranjan, FM Puglisi, N Raghavan, SJ O'Shea… - Applied Physics …, 2018‏ - pubs.aip.org
This study reports the observation of low frequency random telegraph noise (RTN) in a 2D
layered hexagonal boron nitride dielectric film in the pre-and post-soft breakdown phases …

Random telegraph noise: Measurement, data analysis, and interpretation

FM Puglisi, A Padovani, L Larcher… - 2017 IEEE 24th …, 2017‏ - ieeexplore.ieee.org
In this paper, we delve into one of the most relevant defects-related phenomena causing
failures in the operation of modern nanoscale electron devices, namely Random Telegraph …

Localized probing of dielectric breakdown in multilayer hexagonal boron nitride

A Ranjan, SJ O'Shea, M Bosman… - … Applied Materials & …, 2020‏ - ACS Publications
Hexagonal boron nitride (h-BN) has emerged as a promising 2D/layered dielectric owing to
its successful integration with graphene and other 2D materials, although a coherent picture …