SymBIST: Symmetry-Based Analog and Mixed-Signal Built-In Self-Test for Functional Safety

A Pavlidis, MM Louërat, E Faehn… - … on Circuits and …, 2021 - ieeexplore.ieee.org
We propose a Built-In Self-Test (BIST) paradigm for analog and mixed-signal (A/MS)
Integrated Circuits (ICs), called symmetry-based BIST (SymBIST). SymBIST exploits inherent …

Digital-to-analog hardware Trojan attacks

M Elshamy, G Di Natale, A Sayed… - … on Circuits and …, 2021 - ieeexplore.ieee.org
We propose a Hardware Trojan (HT) attack for analog circuits with its key characteristic
being that it cannot be prevented or detected in the analog domain. The HT attack works in …

Testing analog and mixed-signal circuits with built-in hardware—A new approach

SR Das, J Zakizadeh, S Biswas… - IEEE Transactions …, 2007 - ieeexplore.ieee.org
This paper aims to develop an approach to test analog and mixed-signal embedded-core-
based system-on-chips (SOCs) with built-in hardware. In particular, oscillation-based built-in …

Sensors for built-in alternate RF test

L Abdallah, HG Stratigopoulos… - 2010 15th IEEE …, 2010 - ieeexplore.ieee.org
The paper discusses a variety of sensors to enable a built-in test in RF devices. The list of
sensors includes dummy circuits, process control monitors, DC probes, an envelope …

Locking by untuning: A lock-less approach for analog and mixed-signal IC security

M Elshamy, A Sayed, MM Louërat… - … Transactions on Very …, 2021 - ieeexplore.ieee.org
We propose an antipiracy security approach for programmable analog and mixed-signal
(AMS) integrated circuits (ICs). The security approach relies on functionality locking by …

Practical oscillation-based test of integrated filters

G Huertas, D Vázquez, EJ Peralías… - IEEE Design & Test …, 2002 - ieeexplore.ieee.org
Oscillation-based test (OBT) techniques show promise in detecting faults in mixed-signal
circuits and require little modification. to the circuit under test. Comparing both the …

[BOOK][B] Oscillation-based test in mixed-signal circuits

GH Sánchez, JLH Díaz, DVG de la Vega, AR Rueda - 2006 - Springer
Driven by the need of reducing the defective circuits to a minimum, present-day fabrication
technologies require design techniques been complemented by effective test procedures. In …

Experiences with non-intrusive sensors for RF built-in test

L Abdallah, HG Stratigopoulos, S Mir… - … IEEE International Test …, 2012 - ieeexplore.ieee.org
This paper discusses a new type of sensors to enable a built-in test in RF circuits. The
proposed sensors provide DC or low-frequency measurements, thus they can reduce …

Optimal proportion computation with population protocols

Y Mocquard, E Anceaume… - 2016 IEEE 15th …, 2016 - ieeexplore.ieee.org
The computational model of population protocols is a formalism that allows the analysis of
properties emerging from simple and pairwise interactions among a very large number of …

An on-chip spectrum analyzer for analog built-in testing

MG Méndez-Rivera, A Valdes-Garcia… - Journal of Electronic …, 2005 - Springer
This paper presents an analog built-in testing (BIT) architecture and its implementation. It
enables the frequency response and harmonic distortion characterizations of an integrated …