Review of injection dependent charge carrier lifetime spectroscopy
Abstract Characterization and identification of recombination active defects in photovoltaic
(PV) materials are essential for improving the performance of solar cells, hence, reducing …
(PV) materials are essential for improving the performance of solar cells, hence, reducing …
Electrical Characterization of Thermally Activated Defects in n-Type Float-Zone Silicon
Float-zone (FZ) silicon is usually assumed to be bulk defect-lean and stable. However,
recent studies have revealed that detrimental defects can be thermally activated in FZ silicon …
recent studies have revealed that detrimental defects can be thermally activated in FZ silicon …
Temperature‐Dependent Lifetime and Photoluminescence Measurements
Temperature‐dependent measurements are extensively employed in assessing
photovoltaic materials and devices. An obvious reason is that solar cells often operate at …
photovoltaic materials and devices. An obvious reason is that solar cells often operate at …
Investigation of two-level defects in injection dependent lifetime spectroscopy
In the majority of studies involving injection dependent lifetime spectroscopy, it is assumed
that the investigated defect is a single-level defect following Shockley-Read-Hall …
that the investigated defect is a single-level defect following Shockley-Read-Hall …
[LIVRE][B] Assessment and Application of Defect Characterization via Lifetime Spectroscopy in high purity c-Si
R Post - 2023 - kops.uni-konstanz.de
To ensure the best possible efficiency of a solar cell it is necessary to restrict the losses on
every performance level. The very first performance level is the material and its properties …
every performance level. The very first performance level is the material and its properties …
Spatially resolved defects parameters of the D1 dislocation center in silicon using temperature-and injection-dependent hyperspectral photoluminescence map**
RL Chin, M Pollard, Z Hameiri - Solar Energy Materials and Solar Cells, 2021 - Elsevier
The sub-bandgap photoluminescence (PL) arising from dislocations in crystalline silicon
(known as “D-lines”) has been studied for over half a century. However, many properties of …
(known as “D-lines”) has been studied for over half a century. However, many properties of …
17.1 Temperature-Dependent Lifetime Spectroscopy Identification of defects in silicon wafers and cells is essential for their elimination (Graff 2013). Determination of …
The term “lifetime spectroscopy" describes several types of measurement techniques (Rein
2006; Zhu and Hameiri 2021). Temperature-dependent lifetime spectroscopy (TDLS) is …
2006; Zhu and Hameiri 2021). Temperature-dependent lifetime spectroscopy (TDLS) is …
Mathematical model of the development of manufacturing defects in the surface layer of substrates of MOEMS'functional components
A mathematical model of the development of manufacturing defects, with the prediction of
the random component of the model in the substrates of functional components of MOEMS …
the random component of the model in the substrates of functional components of MOEMS …
Automation of Mathematical Modeling of Physical and Technological Processes in the Electronic Devices Manufacture
Анотація The variant of automation of the mathematical modeling process for forecasting
the technological process parameters of manufacturing nano and microelectromechanical …
the technological process parameters of manufacturing nano and microelectromechanical …