Strain‐Engineered 2D Materials: Challenges, Opportunities, and Future Perspectives

AK Katiyar, JH Ahn - Small Methods, 2024 - Wiley Online Library
Strain engineering is a powerful strategy that can strongly influence and tune the intrinsic
characteristics of materials by incorporating lattice deformations. Due to atomically thin …

Nanoscale Operando Imaging of Electrically Driven Charge-Density Wave Phase Transitions

T Domröse, N Fernandez, C Eckel, K Rossnagel… - Nano Letters, 2024 - ACS Publications
Structural transformations in strongly correlated materials promise efficient and fast control of
materials' properties via electrical or optical stimulation. The desired functionality of devices …

4D-STEM in an FIB-SEM: A Proper Tool to Characterize Perovskite Single-Photon Emitters and Solar Cells

V Bajo, P Klok, P Liška, J Kološová… - The Journal of …, 2025 - ACS Publications
Four-dimensional scanning transmission electron microscopy (4D-STEM) is a
characterization technique that allows high-resolution imaging of thin samples while …

[HTML][HTML] Characterization of extended defects in 2D materials using aperture-based dark-field STEM in SEM

P Denninger, P Schweizer, E Spiecker - Micron, 2024 - Elsevier
Quantitative diffraction contrast analysis with defined diffraction vectors is a well-established
method in TEM for studying defects in crystalline materials. A comparable transmission …

Exploring 4DSTEM-in-SEM: From Implementation to Material Characterization

J Müller, C Koch - 2024 - academic.oup.com
Four-dimensional scanning transmission electron microscopy (4DSTEM) is a powerful
diffraction-based technique to investigate electron-transparent samples, probing local …

Benchmarking analytical electron ptychography methods for the low-dose imaging of beam-sensitive materials

HLL Robert, ML Leidl, K Müller-Caspary… - arxiv preprint arxiv …, 2025 - arxiv.org
This publication presents an investigation of the performance of different analytical electron
ptychography methods for low-dose imaging. In particular, benchmarking is performed for …

Data-efficient 4D-STEM in SEM: Beyond 2D Materials to Metallic Materials

U Bansal, A Sharma, B Putz, C Kirchlechner… - arxiv preprint arxiv …, 2024 - arxiv.org
Four-dimensional scanning transmission electron microscopy (4D-STEM) is a powerful tool
that allows for the simultaneous acquisition of spatial and diffraction information, driven by …