Semiconductor manufacturing is a complex multistage manufacturing process, and wafer
fabs use complex processes involving billions of dollars worth of equipment to produce …

This book is a comprehensive guide to new DFT methods that will show the readers how to
design a testable and quality product, drive down test cost, improve product quality and …

Figure 1. Autonomic conductivity restoration concept in a multilayer microelectronic device.
a) The self-healing circuit consists of microencapsulated liquid metal dispersed in a …

An evident challenge ahead for the integrated circuit (IC) industry is the investigation and
development of methods to reduce the design complexity ensuing from growing process …

Functional verification is widely acknowledged as the bottleneck in the hardware design
cycle. This paper addresses one of the main challenges of simulation based verification (or …

Modern electronics testing has a legacy of more than 40 years. The introduction of new
technologies, especially nanometer technologies with 90nm or smaller geometry, has …

Increased power densities (and resultant temperatures) and other effects of device scaling
are predicted to cause significant lifetime reliability problems in the near future. In this paper …

A “Roadmap” is an extended look at the future of a chosen field of inquiry composed from
the collective knowledge of researchers in that field. The composition of a roadmap can …

Digital Microfluidic Biochips focuses on the automated design and production of microfluidic-
based biochips for large-scale bioassays and safety-critical applications. Bridging areas of …

Process parameter variations are expected to be significantly high in a sub-50-nm
technology regime, which can severely affect the yield, unless very conservative design …