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Analyzing aging effects on SRAM PUFs: Implications for security and reliability
The aging effects on Static Random-Access Memory Physical Unclonable Functions (SRAM
PUFs) pose significant security and reliability challenges for current hardware systems …
PUFs) pose significant security and reliability challenges for current hardware systems …
A Process Optimization Method of the Mini‐LOCOS Field Plate Profile for Improving Electrical Characteristics of LDMOS Device
S Yu, W Shao, PX Gao, X Li, R Chen… - IET Circuits, Devices & …, 2023 - Wiley Online Library
In this work, the effects of the mini‐local oxidation of silicon (LOCOS) field plate's bottom
physical profile on the devices' breakdown performance are analyzed through technology …
physical profile on the devices' breakdown performance are analyzed through technology …