In this letter, we demonstrated the possibility of predicting full transistor current-voltage (IV)
and capacitance-voltage (CV) curves using machines trained by Technology Computer …

In this article, using experimental data, we demonstrate that the technology computer-aided
design (TCAD) is a very cost-effective tool to generate the data to build machine learning …

In this paper, we propose and study the use of noise to avoid the overfitting issue in
Technology Computer-Aided Design-augmented machine learning (TCAD-ML). TCAD-ML …

The sensitivity of semiconductor devices to any microscopic perturbation is increasing with
the continuous shrinking of device technology. Even the small fluctuations have become …

Complementary field-effect transistors (CFETs), which are structures in which different types
of transistors are vertically stacked with a shared control gate, are being focused on for …

To improve the manufacturing process of GaN wafers, inexpensive wafer screening
techniques are required to both provide feedback to the manufacturing process and prevent …

In this article, the possibilities of accurate prediction of wide range of parameters and
optimizing the same through machine learning (ML) approach have been demonstrated for …

A photonic crystal fiber (PCF) structure which offers exceptional research prospects to
design sensors is eccentrically found applicable in wide variety of fields and thus have …

It is desirable to monitor the degradation of integrated circuits (ICs) or perform their failure
analysis through their electrical characteristics [such as the voltage-transfer characteristic …

As Fin Field Effect Transistor (FinFET) scales aggressively, even a single point defect
becomes a source of performance variability. The point defect is inevitably introduced not …