Area-selective deposition: fundamentals, applications, and future outlook

GN Parsons, RD Clark - Chemistry of Materials, 2020 - ACS Publications
This review provides an overview of area-selective thin film deposition (ASD) with a primary
focus on vapor-phase thin film formation via chemical vapor deposition (CVD) and atomic …

Self-aligned patterning of tantalum oxide on Cu/SiO2 through redox-coupled inherently selective atomic layer deposition

Y Li, Z Qi, Y Lan, K Cao, Y Wen, J Zhang, E Gu… - Nature …, 2023 - nature.com
Atomic-scale precision alignment is a bottleneck in the fabrication of next-generation
nanoelectronics. In this study, a redox-coupled inherently selective atomic layer deposition …

“Dual-Tone” Area-Selective Deposition: Selectivity Inversion of Polymer on Patterned Si/SiO2 Starting Surfaces

NM Carroll, HRM Margavio, GN Parsons - Chemistry of Materials, 2024 - ACS Publications
Area-selective deposition (ASD) has recently emerged as a promising augmentation of
lithographic patterning of small device features. However, current ASD processes are …

Fully self-aligned via integration for interconnect scaling beyond 3nm node

HP Chen, YH Wu, HY Huang, CH Tsai… - 2021 IEEE …, 2021 - ieeexplore.ieee.org
Two fully self-aligned via (SAV) integration schemes by metal recess approach and area-
selective dielectric-on-dielectric (DoD) method are reported in this paper. A topography with …

NS3K: A 3-nm nanosheet FET standard cell library development and its impact

T Kim, J Jeong, S Woo, J Yang, H Kim… - … Transactions on Very …, 2022 - ieeexplore.ieee.org
Nanosheet FETs (NSFETs) are attracting attention as promising devices that can replace
FinFETs beyond the 5-nm node. Despite the importance of the devices, few studies analyze …

Dielectric-on-Dielectric Achieved on SiO2 in Preference to W by Water-free Chemical Vapor Depositions with Aniline Passivation

J Huang, Y Cho, V Wang, Z Zhang, J Mu… - … Applied Materials & …, 2023 - ACS Publications
Selective and smooth dielectric-on-dielectric was achieved by water-free single-precursor
chemical vapor deposition (CVD) processes with the help of aniline passivation. Aniline …

Controlled cobalt recess for advanced interconnect metallization

A Pacco, Y Akanishi, QT Le, E Kesters… - Microelectronic …, 2019 - Elsevier
We have developed a wet chemical etch process for the controlled recess of cobalt metal
based on 'digital etching'. Digital etching is a cyclic process wherein each process cycle …

Area-Selective Molecular Layer Deposition of a Silicon Oxycarbide Low-k Dielectric

X Yu, D Bobb-Semple, IK Oh, TL Liu… - Chemistry of …, 2021 - ACS Publications
Area-selective deposition (ASD) of low-k materials is desired in back-end-of-line processes
for fabricating nanopatterns such as fully self-aligned vias. However, the high temperature …

ASAP5: A predictive PDK for the 5 nm node

V Vashishtha, LT Clark - Microelectronics Journal, 2022 - Elsevier
We present a predictive process design kit (PDK) for the 5 nm technology node, the ASAP5
PDK. ASAP5 is not related to a particular foundry and the assumptions are derived from …

Plasma atomic layer etching of ruthenium by oxygen adsorption-removal cyclic process

D San Kim, HI Kwon, YJ Jang, GC Kim, HS Gil… - Applied Surface …, 2024 - Elsevier
Ruthenium (Ru) is a next-generation metal interconnect material, and the demand for
precise etching is on the rise. This study explores anisotropic atomic layer etching (ALE) of …