Models for energy loss in XPS are reviewed. We start with rigorous models to describe the
fundamental interaction of the electric fields from both the core-hole and the moving electron …

The energy loss functions (ELFs) and optical constants of Si and SiO 2 were obtained from
quantitative analysis of reflection electron energy loss spectroscopy (REELS) by a new …

Reflection electron energy loss spectra (REELS) are presented for medium energy (200eV
to 5keV) electrons backscattered from Si, Ni, Ge and Ag surfaces. Multiple bulk inelastic …

Abstract Photoelectron Energy Loss Spectroscopy (PEELS) is a highly valuable non
destructive tool in applied surface science because it gives access to both chemical …

Elastic peak electron spectroscopy (EPES) provides inelastic mean free path (IMFP) values
in the near-surface region. Such values, which will be called effective IMFPs, might be …

The angular dependence of the surface excitation parameter (SEP) is theoretically
determined for different materials (Ti, Fe, Cu, Pd, Ag, and Au) for angles to the surface …

The phenomenon of surface excitation is competitive in nature for elastic and other inelastic
scattering processes in surface electron spectroscopies; the knowledge of influence of …

Recently two papers have been published deriving the dielectric function from hafnia from
electron energy loss data (** et al. Applied Physics Letters 100 083713 (2006), Behar et al …

The angular distribution of the surface excitation parameter (SEP) was theoretically
determined for four oxide materials (TiO2, SiO2, ZrO2, Al2O3) and for electron energies of …

The surface excitation parameter (SEP) is calculated for five carbon allotropes: amorphous
carbon, graphite, glassy carbon, C60‐fullerite and diamond for electron energies between …