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The development and progress of multi-physics simulation design for TSV-based 3D integrated system
In order to meet the requirements of high performance, miniaturization, low cost, low power
consumption and multi-function, three-dimensional (3D) integrated technology has gradually …
consumption and multi-function, three-dimensional (3D) integrated technology has gradually …
Thermal TSV optimization and hierarchical floorplanning for 3-D integrated circuits
While 3-D integrated circuits (ICs) offer many advantages over 2-D ICs, thermal
management challenges remain unresolved. Thermal through-silicon-vias (TTSVs) are …
management challenges remain unresolved. Thermal through-silicon-vias (TTSVs) are …
[HTML][HTML] The integration of double-layer triangular micro-channel in three-dimensional integrated circuits for enhancing heat transfer performance
H Huang, Z Zeng, P Xu - Case Studies in Thermal Engineering, 2024 - Elsevier
This paper proposed a new heat dissipation structure called double-layer triangular micro-
channel (DLTMC) to solve the increasingly serious thermal problem of three-dimensional …
channel (DLTMC) to solve the increasingly serious thermal problem of three-dimensional …
Efficient transient thermal analysis of chiplet heterogeneous integration
C Nie, Q Xu, C Wang, H Cao, J Liu, Z Li - Applied Thermal Engineering, 2023 - Elsevier
Thermal issue has significant effect on the reliability and performance of integrated circuits
with the increase of integrated density, especially for 2.5-D and 3-D heterogeneous …
with the increase of integrated density, especially for 2.5-D and 3-D heterogeneous …
Equivalent thermal model of through silicon via and bump for advanced packaging of integrated circuits
C Nie, Q Xu, L Chen - Microelectronics Reliability, 2022 - Elsevier
Thermal issue is a quite critical factor in influencing the performance of integrated circuits
(ICs) with the increase of the device integration density. Through silicon via (TSV) and bump …
(ICs) with the increase of the device integration density. Through silicon via (TSV) and bump …
Thermal performance analysis of carbon materials based TSV in three dimensional integrated circuits
P Xu, H Huang, BQ Zhang, ZH Tang - IEEE Access, 2023 - ieeexplore.ieee.org
This paper applies the carbon materials (ie, SWCNT, MWCNT, and GNR) as new
prospective filler materials of through silicon vias (TSV) for replacing the conventional …
prospective filler materials of through silicon vias (TSV) for replacing the conventional …
Transient thermal analysis of system-in-package technology by the finite element method (FEM)
Since accurate thermal analysis is essential for the design and thermal management of
System-in-Package (SiP). This paper proposes a transient thermal analysis of the System-in …
System-in-Package (SiP). This paper proposes a transient thermal analysis of the System-in …
Transient thermal analysis of 3-D integrated circuits packages by the DGTD method
Since accurate thermal analysis plays a critical role in the thermal design and management
of the 3-D system-level integration, in this paper, a discontinuous Galerkin time-domain …
of the 3-D system-level integration, in this paper, a discontinuous Galerkin time-domain …
An effective approach for thermal performance analysis of 3-D integrated circuits with through-silicon vias
J Chai, G Dong, Y Yang - IEEE Transactions on Components …, 2019 - ieeexplore.ieee.org
To investigate the thermal behavior of 3-D integrated circuits, long computational times are
required for large-scale stacked chips with a complicated structure. In this paper, an …
required for large-scale stacked chips with a complicated structure. In this paper, an …
Efficient transient thermal simulation of ICs and packages with Laguerre-based finite-element method
B Li, M Tang, H Yue, Y Tang… - IEEE Transactions on …, 2019 - ieeexplore.ieee.org
In this article, an efficient approach based on Laguerre-based finite-element method
(LBFEM) is proposed for transient thermal simulation of integrated circuits (ICs) and …
(LBFEM) is proposed for transient thermal simulation of integrated circuits (ICs) and …