(57) ABSTRACT A static random access memory (SRAM) cell includes substrate, a first
semiconductor fin, a first gate structure, a second semiconductor fin, and a second gate …

(57) ABSTRACT A method for performing multiple simulations for a circuit using a first
plurality of samples is provided. The method includes obtaining a model of the circuit based …

A system and method of simulating device aging based on a digital waveform representative
of a workload of an electronic device are disclosed. In one aspect, the method comprises …

(57) ABSTRACT A semiconductor device includes a substrate, a first transis tor, and a
second transistor. The first transistor is disposed on the substrate. The second transistor is …

(57) ABSTRACT A system for testing memory includes logic that is configured to perform
various normal memory operations (eg, erase, read and write operations) on a memory …

2022-06-03 Assigned to TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
reassignment TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. ASSIGNMENT OF …

A memory authentication system initiates various memory operations on a memory chip and
then assesses the performance of the memory chip in performing such operations in an …

(57) ABSTRACT A computer-implemented method for simulation of an integrated circuit for
yield analysis includes: a) for plurality of variables, generating initial sampling sets by …

US20210390238A1 - Simulation and analysis of circuit designs - Google Patents
US20210390238A1 - Simulation and analysis of circuit designs - Google Patents …

US10909293B1 - Sampling selection for enhanced high yield estimation in circuit designs -
Google Patents US10909293B1 - Sampling selection for enhanced high yield estimation in …