A review of bayesian methods in electronic design automation
The utilization of Bayesian methods has been widely acknowledged as a viable solution for
tackling various challenges in electronic integrated circuit (IC) design under stochastic …
tackling various challenges in electronic integrated circuit (IC) design under stochastic …
A fast and provably bounded failure analysis of memory circuits in high dimensions
Memory circuits have become important components in today's IC designs which demands
extremely high integration density and reliability under process variations. The most …
extremely high integration density and reliability under process variations. The most …
Gradient importance sampling: An efficient statistical extraction methodology of high-sigma SRAM dynamic characteristics
The impact of within-die transistor variability has increased with CMOS technology scaling
up to the point where it has emerged as a systematic problem for the designer. Estimating …
up to the point where it has emerged as a systematic problem for the designer. Estimating …
Importance boundary sampling for SRAM yield analysis with multiple failure regions
J Yao, Z Ye, Y Wang - … on Computer-Aided Design of Integrated …, 2014 - ieeexplore.ieee.org
SRAM cells generally require an extremely low failure rate (ie, high yield) in the per cell
basis to ensure a reasonably moderate yield for the whole chip. Existing yield analysis …
basis to ensure a reasonably moderate yield for the whole chip. Existing yield analysis …
Efficient statistical model checking of hardware circuits with multiple failure regions
Statistical model checking (SMC) is a simulation-based approach for verifying the statistical
properties of large, complex systems. If a large number of low-probability events (rare …
properties of large, complex systems. If a large number of low-probability events (rare …
Component reliability modeling through the use of Bayesian networks and applied physics-based models
The objective of the work presented in this paper is to develop a practical methodology to
support order of magnitude probabilistic prediction of Commercial Off-The Shelf (COTS) …
support order of magnitude probabilistic prediction of Commercial Off-The Shelf (COTS) …
Stochastic behavioral modeling of analog/mixed-signal circuits by maximizing entropy
Maximum entropy (MAXENT) is a powerful and flexible method for estimating the arbitrary
probabilistic distribution of a stochastic variable with moment constraints. However …
probabilistic distribution of a stochastic variable with moment constraints. However …
Asymmetric sizing: An effective design approach for SRAM cells against BTI aging
X Zuo, SK Gupta - 2017 IEEE 35th VLSI Test Symposium (VTS), 2017 - ieeexplore.ieee.org
The rate of aging of ICs is increasing with the continued reduction in feature sizes of devices.
Bias temperature instability (BTI) is considered to be the major reliability hazard in nano …
Bias temperature instability (BTI) is considered to be the major reliability hazard in nano …
Accurate multi-segment probability density estimation through moment matching
R Krishnan, W Wu, S Bodapati… - IEEE Transactions on …, 2016 - ieeexplore.ieee.org
The impact of process variations continues to grow as transistor feature size shrinks. Such
variations in transistor parameters lead to variations and unpredictability in circuit output and …
variations in transistor parameters lead to variations and unpredictability in circuit output and …
Generic high-dimensional importance sampling methodology
A method of circuit yield analysis for evaluating rare failure events includes performing initial
sampling to detect failed samples respectively located at one or more failure regions in a …
sampling to detect failed samples respectively located at one or more failure regions in a …